Abstract: Disclosed herein are interferometric measurement systems and methods. In one exemplary embodiment an interferometric measuring system for measuring the distance to or displacement of an object includes: a light source; an interferometer with a measuring arm and a reference arm; a dispersive medium; and a detector. The interferometer is disposed between the light source and the object. The dispersive medium is arranged to unbalance the dispersion between the measurement arm and the reference arm. The detector is arranged to detect spectrum interference from the interferometer. In one example, the dispersive medium is a chirped fiber Bragg grating. In another example, the dispersive medium is a highly dispersive optical fiber. In one example, the light source is a broadband light source, and the detector includes a spectrometer. In another example, the light source is a wavelength swept laser, and the detector includes a photodetector or a balanced photodetector.

Abstract: Disclosed herein are interferometric measurement systems and methods. In one exemplary embodiment an interferometric measuring system for measuring the distance to or displacement of an object includes: a light source; an interferometer with a measuring arm and a reference arm; a dispersive medium; and a detector. The interferometer is disposed between the light source and the object. The dispersive medium is arranged to unbalance the dispersion between the measurement arm and the reference arm. The detector is arranged to detect spectrum interference from the interferometer. In one example, the dispersive medium is a chirped fiber Bragg grating. In another example, the dispersive medium is a highly dispersive optical fiber. In one example, the light source is a broadband light source, and the detector includes a spectrometer. In another example, the light source is a wavelength swept laser, and the detector includes a photodetector or a balanced photodetector.

Abstract: A system is provided for gathering information and data on the surface characteristics of an object includes a projector, a table, a first camera and a second camera. The projector is suspended above the table and arranged to project a random pattern of optical indicators onto the table. The optical indicators can be dots, lines, or other such indicators. The table is arranged to hold the object to be inspected. The first camera is positioned above and to one side of the table and angled toward the table. The second camera is positioned above and to opposite side of the table and angled toward the table. The first and second cameras are arranged to capture images of the optical indicators projected onto the object. The system is further arranged to gather information and data from the captured images and determine the surface characteristics of the object from said gathered information and data.