Patents Assigned to AppFive LLC
  • Method and system for improving characteristic peak signals in analytical electron microscopy
    Patent number: 9406496
    Abstract: A method and system are disclosed for improving characteristic peak signals in electron energy loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDS) measurements of crystalline materials. A beam scanning protocol is applied which varies the inclination, azimuthal angle, or a combination thereof of the incident beam while spectroscopic data is acquired. The method and system may be applied to compositional mapping.
    Type: Grant
    Filed: November 19, 2012
    Date of Patent: August 2, 2016
    Assignees: UNIVERSITAT DE BARCELONA, NANOMEGAS SPRL, APPFIVE LLC
    Inventors: Sonia Estrade Albiol, Joaquin Portillo Serra, Francisca Peiró Martinez, José Manuel Rebled Corsellas, Lluís Yedra Cardona, Stavros Nicolopoulos, Steven Kim, Jon Karl Weiss
  • METHOD AND SYSTEM FOR IMPROVING CHARACTERISTIC PEAK SIGNALS IN ANALYTICAL ELECTRON MICROSCOPY
    Publication number: 20130240728
    Abstract: A method and system are disclosed for improving characteristic peak signals in electron energy loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDS) measurements of crystalline materials. A beam scanning protocol is applied which varies the inclination, azimuthal angle, or a combination thereof of the incident beam while spectroscopic data is acquired. The method and system may be applied to compositional mapping.
    Type: Application
    Filed: November 19, 2012
    Publication date: September 19, 2013
    Applicants: Universitat de Barcelona, AppFive LLC, Nanomegas SPRL
    Inventors: Sonia Estrade Albiol, Joaquin Portillo Serra, Francisca Peiro Martinez, José Manuel Rebled Corsellas, Lluis Yedra Cardona, Stavros Nicolopoulos, Steven Kim, Jon Karl Weiss