Patents Assigned to Appiled Materials, Inc.
  • Patent number: 7464917
    Abstract: Embodiments of the invention provide an apparatus for generating a precursor gas used in a vapor deposition process system. The apparatus contains a canister or an ampoule for containing a chemical precursor and a splash guard contained within the ampoule. The splash guard is positioned to obstruct the chemical precursor in a liquid state from being bumped or splashed into a gas outlet during the introduction of a carrier gas into the ampoule. The carrier gas is usually directed into the ampoule through a gas inlet and combines with the vaporized chemical precursor to form a precursor gas. The splash guard is also positioned to permit the passage of the precursor gas from the gas outlet. In one example, the gas outlet contains a stem with a tapered tip and the splash guard is positioned at an angle parallel to the plane of the tapered tip.
    Type: Grant
    Filed: October 7, 2005
    Date of Patent: December 16, 2008
    Assignee: Appiled Materials, Inc.
    Inventors: Wei Ti Lee, Steve H. Chiao
  • Patent number: 7430104
    Abstract: An electrostatic chuck is configured for electrostatically securing a wafer while limiting charge on the wafer and physical contact between the electrostatic chuck and the wafer. The electrostatic chuck has a pair of electrodes and at least one support pin electrically isolated from the electrodes. The top portion of the support pin protrudes above the top surface of the electrodes. The support pin can be such that the top portion of the support pin is adjustable with respect to the top surfaces of the electrodes.
    Type: Grant
    Filed: May 29, 2003
    Date of Patent: September 30, 2008
    Assignee: Appiled Materials, Inc.
    Inventors: Alon Litman, Igor Krivts
  • Patent number: 6676760
    Abstract: A substrate processing chamber has a substrate support to support a substrate, and an exhaust conduit about the substrate support. A first process gas distributor directs a first process gas, such as a non-reactive gas, about the substrate perimeter and toward the exhaust conduit at a first flow rate to form a curtain of non-reactive gas about the substrate. A second process gas distributor directs a second process gas, such as reactive CVD or etchant gas, toward a central portion of the substrate at a second flow rate which is lower than the first flow rate. A gas energizer energizes the first and second process gases in the chamber. A controller operates the substrate support, gas flow meters, gas energizer, and throttle valve, to process the substrate in the energized gas.
    Type: Grant
    Filed: August 16, 2001
    Date of Patent: January 13, 2004
    Assignee: Appiled Materials, Inc.
    Inventors: Arnold V. Kholodenko, Dan Katz, Wing L. Cheng