Abstract: An artificial intelligence based method and apparatus for locating faults in electronic units includes a technique for modelling electronic units in terms of behavioral constraints. Behavioral constraints model circuit components in terms of changes in outputs thereof which result from changes in inputs thereto. These changes, referred to as "phase changes" may be supplemented by gain and compliance constraints to model an electronic unit at all functional abstraction or hierarchical decomposition levels thereof. In addition to providing a universal modelling scheme, behavioral constraint relationships provide a highly accurate indication of subtle changes in a circuit, for accurate fault location or troubleshooting.Troubleshooting takes place by applying a predetermined search strategy on the electronic unit which is represented by behavioral constraints. The search strategy begins with a top down search.
Type:
Grant
Filed:
July 5, 1989
Date of Patent:
October 20, 1992
Assignee:
Applied Diagnostics, Inc.
Inventors:
Charles W. Buenzli, Jr., Ravi Rastogi, Kenneth F. Sierzega, Maurice M. Tayeh