Patents Assigned to Applied Intellegent Systems, Inc.
  • Patent number: 4736397
    Abstract: A radiation image inspection apparatus for inspecting articles. The inspection apparatus includes a radiation source which generates and directs radiation, preferably x-rays, toward and around the article. The radiation penetrates and passes around the article and strikes a screen having a coating formed of a rare earth element. The coating exhibits fluorescence when struck by incident radiation and becomes illuminated, generating a first light image of the article. The first light image passes through a plurality of lenses which maintain the intensity of the light image before striking a camera having a front camera screen. The camera by means of an internal sweep beam scans the camera screen and generates an electrical output signal corresponding to the image on the camera screen. A controller controls the operation of the camera and radiation source in either of two modes.
    Type: Grant
    Filed: December 16, 1985
    Date of Patent: April 5, 1988
    Assignee: Applied Intellegent Systems, Inc.
    Inventor: Juan F. Velasquez
  • Patent number: 4719439
    Abstract: A thermal saddle for a camera tube deflection yoke which dissipates heat from the camera tube and deflection yoke to enable the use of maximum operating voltages on the camera tube for enhanced resolution. The thermal saddle includes a base formed of a high heat dissipation material having spaced, planar flanges mounted within the camera housing. A concave, central portion is formed between the flanges and is sized to securely receive and support the deflection yoke and to dissipate heat therefrom. A strap surrounds the delection yoke and is secured to the base to securely mount the deflection yoke on the base.
    Type: Grant
    Filed: November 25, 1985
    Date of Patent: January 12, 1988
    Assignee: Applied Intellegent Systems, Inc.
    Inventor: Juan F. Velasquez