Patents Assigned to Applied Materials Japan, Inc.
  • Patent number: 5728278
    Abstract: A plasma processing apparatus has a vacuum container which contains a pair of electrodes for causing a discharge for generating a plasma, and a shielding plate for separating a plasma processing region including a space between the electrodes from a region in contact with the inner wall of the vacuum container in such a manner that both the regions communicate with each other. The apparatus includes a means for causing a pressure difference between the plasma processing region and the region in contact with the inner wall of the vacuum container.
    Type: Grant
    Filed: November 14, 1994
    Date of Patent: March 17, 1998
    Assignee: Canon Kabushiki Kaisha/Applied Materials Japan Inc.
    Inventors: Nobuyuki Okamura, Atsushi Yamagami, Tadahiro Ohmi, Haruhiro Harry Goto, Tadashi Shibata
  • Patent number: 5316645
    Abstract: A plasma processing apparatus comprises: a first electrode connectable with a plasma generating power source; a second electrode capable of supporting a substrate to be subjected to a plasma-involving surface treatment; a third electrode enclosing a space between the first and second electrodes, all the electrodes being positioned in an evacuatable chamber; and potential control means for controlling the potential of the third electrode.
    Type: Grant
    Filed: February 17, 1993
    Date of Patent: May 31, 1994
    Assignees: Canon Kabushiki Kaisha, Applied Materials Japan Inc., Tadahiro Ohmi
    Inventors: Atsushi Yamagami, Nobuyuki Okamura, Tadahiro Ohmi, Haruhiro H. Goto, Tadashi Shibata
  • Patent number: 4731255
    Abstract: A gas-phase growth process for growing films of uniform thickness or having a prescribed pattern form or growing films sequentially onto a substrate and an apparatus related thereto. The films are grown by allowing an inert gas to flow over a reaction gas flow in parallel to the surface of the substrate. Optionally, the substrate surface could be irradiated by a UV light source which is directed from above the inert gas toward the substrate surface.
    Type: Grant
    Filed: September 26, 1985
    Date of Patent: March 15, 1988
    Assignee: Applied Materials Japan, Inc.
    Inventors: Kazuo Maeda, Noboru Tokumasu, Toshihiko Fukuyama, Tsugiaki Hirata
  • Patent number: 4702936
    Abstract: A gas-phase growth process for forming a film of SiO.sub.2 Si.sub.3 N.sub.4 or Si.sub.x O.sub.y N.sub.z, which comprises reacting a mixture of an organic or inorganic silane with one or more reaction gases comprising O.sub.2, N.sub.2 O, NO.sub.2 NO, CO.sub.2 CO and NH.sub.3, with the proviso that the mixture of inorganic silane and O.sub.2 is excluded as a reaction gas combination of the present invention. The process comprises feeding a reaction gas into a reaction chamber which is kept at a reaction temperature below 500.degree. C., and subjecting the surface of a substrate chamber which is placed in the reaction chamber to UV irradiation. This irradiation excites the reaction gas, which allows a low-temperature gas-phase growth to proceed. The photo-excitation occurs selectively only at UV-irradiated sections, so that a film growth may occur selectively on the substrate surface within the range of UV irradiation.
    Type: Grant
    Filed: September 20, 1985
    Date of Patent: October 27, 1987
    Assignee: Applied Materials Japan, Inc.
    Inventors: Kazuo Maeda, Noboru Tokumasu, Toshihiko Fukuyama