Patents Assigned to Applied Physics Systems, Inc.
  • Patent number: 11940509
    Abstract: A magnetometer includes a magnetically isolated chamber having an opening to receive a sample; one or more Optically Pumped Magnetometer (OPM) sensors positioned inside the magnetically isolated chamber; an actuator mounted on a frame, the actuator moving an end portion in and out of the magnetically isolated chamber; and a sample holder coupled to the end portion.
    Type: Grant
    Filed: July 18, 2022
    Date of Patent: March 26, 2024
    Assignee: Applied Physics Systems, Inc.
    Inventor: William Goodman
  • Patent number: 10677812
    Abstract: Systems and methods are disclosed for generating temperature compensated acceleration data in analog and digital format from a torque balance accelerometer (TBA). During manufacture of the TBA, a calibration process is used for measuring a TBA scale factor and offset. After collecting scale and offset data, said data is loaded into the memory of the TBA. Field operation of the device includes: sensing a current temperature, retrieving the closest scale and offset correction factors from memory of the TBA, and performing linear interpolation to generate a temperature-compensated output for the TBA.
    Type: Grant
    Filed: July 12, 2019
    Date of Patent: June 9, 2020
    Assignee: Applied Physics Systems, Inc.
    Inventor: William Goodman