Patents Assigned to Applied Precision, LLC, a Washington corporation
  • Method for optimizing probe card analysis and scrub mark analysis data
    Publication number: 20020171414
    Abstract: A method for quantitatively determining probe card errors relying on merging data sets from a probe card analysis machine and a scrub mark analysis machine. Minimizing error values related to the data sets provides an indication of probe card/probe machine combination tolerance.
    Type: Application
    Filed: July 2, 2002
    Publication date: November 21, 2002
    Applicant: Applied Precision, LLC, a Washington corporation
    Inventor: John Strom