Patents Assigned to Applied Precision
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Publication number: 20050006595Abstract: A system and method employing photokinetic techniques in cell biology imaging applications are disclosed. Systems and methods of acquiring image data of an object may comprise: selectively inducing photoactivation of material at a site on the object; performing an optical axis integration scan; simultaneously executing a time delay integration scan sequence; and processing acquired image data in accordance with one or more desired analyses. Various methodologies and applications may include, inter alia, selective photobleaching of a site on the object, diffusion rate, velocity, and wave-front propagation analyses, multi-dimensional analyses of dispersion characteristics, biomolecular binding in cellular organelles, and photoactivation assisted systematic image segmentation for the study of cellular components.Type: ApplicationFiled: June 18, 2004Publication date: January 13, 2005Applicant: Applied Precision, LLCInventors: Paul Goodwin, Carl Brown, Steven Reese
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Publication number: 20040227504Abstract: By examining scrub mark properties (such as position and size) directly, the performance of a wafer probing process may be evaluated. Scrub mark images are captured, image data measured, and detailed information about the process is extracted through analysis. The information may then be used to troubleshoot, improve, and monitor the probing process.Type: ApplicationFiled: February 27, 2004Publication date: November 18, 2004Applicant: Applied Precision, LLCInventor: John T. Strom
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Patent number: 6806595Abstract: A high-precision, low backlash linear actuator drive mechanism characterized by minimal positional repeatability error irrespective of the direction from which a selected or target position is approached may comprise a bellows coupling operative to transmit rotational motion from a motor to a drive spindle. Rotation of the drive spindle causes linear translation thereof in an axial direction.Type: GrantFiled: December 18, 2002Date of Patent: October 19, 2004Assignee: Applied Precision, LLCInventor: Steven C. Quarre
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Patent number: 6781753Abstract: A Z-axis stage for use in, e.g., an orthogonal motion microscope stage, includes a carrier plate, an actuator plate, and a base. Three or more upper camming elements with downwardly directed camming surfaces are mounted to the underside of the carrier plate using a semi-kinematic mounting technique. Three or more lower camming elements with upwardly directed camming surfaces are mounted to the top surface of the base using a semi-kinematic mounting technique. The actuator plate includes apertures to accommodate the lower camming elements and the upper and lower camming surfaces of adjacent camming elements are mated. Linear slides are interposed between the mated camming surfaces and the lower camming elements and the base. Movement of the actuator plate in an X-Y reference plane translates into movement of the carrier plate along the Z-axis (i.e., the optical axis) in response to the relative, sliding motion of the mated camming elements.Type: GrantFiled: December 31, 2001Date of Patent: August 24, 2004Assignee: Applied Precision, LLCInventor: Gary M. Gunderson
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Publication number: 20040084648Abstract: A precision controlled fast valve includes a diaphragm, a piezo actuator, and a plunger. The plunger is adapted to engage the diaphragm to create a seal which closes the valve. The piezo actuator is attached to the plunger and adapted to receive control signals which define the distance and speed of travel of the plunger. A control signal is received by the piezo actuator which causes the plunger to rapidly travel to a first position which is proximate to the diaphragm but does not create a seal. A second control signal is received by the piezo actuator which causes the plunger to pinch the diaphragm and creates a seal (due to the blocked force generated by the piezo). Creating the seal without excessive forces reduces the wear on the seal, allowing longer intervals between maintenance.Type: ApplicationFiled: October 20, 2003Publication date: May 6, 2004Applicant: Applied Precision, LLCInventor: Steven C. Quarre
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Patent number: 6710798Abstract: A probe card inspection system uses a fiduciary plate having a plurality of targets deposited thereon by photolithography and vapor deposition. A plurality of semiconductor probe card probe tips are contacted with the fiducial pattern on the plate. An electronic imaging system determines the position of geometric centroids of the probe tips with respect to an index mark in the fiducial pattern. A central processor determines the position of each imaged probe tip(s) with respect to the index mark, and calculates the relative positions of each probe tip from that data.Type: GrantFiled: March 9, 1999Date of Patent: March 23, 2004Assignee: Applied Precision LLCInventors: Ron Hershel, Rich Campbell, Timothy S. Killeen, Donald B. Snow
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Publication number: 20040008515Abstract: A fluorescence microscopy system and method allow selective and repeatable switching between Köhler illumination, providing a relatively large field of view, and Critical Illumination, providing a relatively higher axial resolution. This switching or toggle function may be facilitated by a feature associated with an alignment module that allows the focus of the fiber tip, for example, to be selectively and repeatably transitioned between the back aperture of the objective lens and the object plane without losing optical alignment.Type: ApplicationFiled: June 11, 2003Publication date: January 15, 2004Applicant: Applied PrecisionInventors: Carl S. Brown, James A. Roecker, Peter C. Lombrozo, Paul C. Goodwin
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Patent number: 6621262Abstract: A method for quantitatively determining probe card errors relying on merging data sets from a probe card analysis machine and a scrub mark analysis machine. Minimizing error values related to the data sets provides an indication of probe card/probe machine combination tolerance.Type: GrantFiled: July 2, 2002Date of Patent: September 16, 2003Assignee: Applied Precision, LLCInventor: John Strom
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Publication number: 20020171414Abstract: A method for quantitatively determining probe card errors relying on merging data sets from a probe card analysis machine and a scrub mark analysis machine. Minimizing error values related to the data sets provides an indication of probe card/probe machine combination tolerance.Type: ApplicationFiled: July 2, 2002Publication date: November 21, 2002Applicant: Applied Precision, LLC, a Washington corporationInventor: John Strom
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Patent number: 6414477Abstract: A method for quantitatively determining probe card errors relying on merging data sets from a probe card analysis machine and a scrub mark analysis machine. Minimizing error values related to the data sets provides an indication of probe card/probe machine combination tolerance.Type: GrantFiled: June 7, 1999Date of Patent: July 2, 2002Assignee: Applied Precision, Inc.Inventor: John Strom
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Patent number: 5899437Abstract: A cam actuated valve method and apparatus utilize an electronically controlled stepper motor driving a cam. A diaphragm type low flow, high accuracy diaphragm valve is positioned off axis with respect to the cam. A transmission translates linear motion of the cam to the valve diaphragm. High accuracy is maintained because the transmission is preloaded by pressure within the valve and the valve diaphragm.Type: GrantFiled: December 12, 1997Date of Patent: May 4, 1999Assignee: Applied Precision, Inc.Inventor: Steven C. Quarre
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Patent number: 5831443Abstract: A probe card array check plate is provided with transition zones to prevent a semi-conductor probe from impacting an epoxy joint in the check plate during an over travel test. The transition zone is in the form of beveled edges or tapers between first and second testing surfaces. In alternate embodiments, two or more different types of testing surfaces are juxta positioned, or an optical measurement window is made sufficiently large to prevent an over traveling probe tip from entering an epoxied area.Type: GrantFiled: June 5, 1996Date of Patent: November 3, 1998Assignee: Applied Precision, Inc.Inventors: Steven C. Quarre, John P. Stewart
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Patent number: 5812310Abstract: A high accuracy, orthogonal motion stage for microscopes and the like uses three frames for orthogonal motion. The lower most frame has provided thereon a series of downwardly depending ramps. An actuator plate having correspondingly positioned, upwardly directed ramps is translated with respect to the lower most frame to raise and lower the frames.Type: GrantFiled: October 16, 1996Date of Patent: September 22, 1998Assignee: Applied Precision, Inc.Inventors: John P. Stewart, Thurmond R. Smith, Gary M. Gunderson
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Patent number: 5744884Abstract: A linear motion micropositioning device employs a housing containing fixed, electrically excited stators. A rotating permanent magnet rotor is directly attached to a spindle of a precision lead screw. The stators are provided with sufficient axial depth to permit the rotor to rotate and reciprocate axially while under continuous magnetic influence of the stators.Type: GrantFiled: October 17, 1995Date of Patent: April 28, 1998Assignee: Applied Precision, Inc.Inventor: Gregory J. Gerhard
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Patent number: 5684628Abstract: An orthogonal motion stage provides Z axis motion, along an optical axis independently of translational motion in an orthogonal, X-Y axis reference plane. Conversely, motion in the X-Y reference plane does not induce unwanted motion in the Z axis. Straight line mechanisms interconnect the Z axis carrier to a base plate. Flexible connections are used in the straight line mechanisms to ensure accurate orthogonal motion.Type: GrantFiled: February 15, 1995Date of Patent: November 4, 1997Assignee: Applied Precision, Inc.Inventor: Gregory J. Gerhard
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Patent number: 5508629Abstract: A method and apparatus for inspecting integrated circuit probe cards in which the probe points of the probe card are scanned across a checkplate having a conductivity transition border. The impedances between the probe points and the checkplate as they cross the conductivity transition border are measured to determine when the probe points cross the border. The positions of the probe card when each of the probe points crosses the border are measured to determine the positions of the probe points relative to each other. In one embodiment, the checkplate is formed by a square conductive plate having three quadrants of insulated material and a single quadrant of conductive material mounted on its upper surface. These conductive strips connected to the conductive plate are positioned between the quadrants of insulative material to form the conductivity transition border. In other embodiments, multiple parallel strips or a single dot of conductive material are surrounded by insulative material.Type: GrantFiled: April 22, 1991Date of Patent: April 16, 1996Assignee: Applied Precision, Inc.Inventors: John P. Stewart, Ronald C. Seubert, Donald B. Snow
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Patent number: 5060371Abstract: A method and apparatus for inspecting integrated circuit probe cards in which the probe points of the probe card are scanned across a checkplate having a conductivity transition border. The impedances between the probe points and the checkplate as they cross the conductivity transition border are measured to determine when the probe points cross the border. The positions of the probe card when each of the probe points crosses the border are measured to determine the positions of the probe points relative to each other. In one embodiment, the checkplate is formed by a square conductive plate having three quadrants of insulated material and a single quadrant of conductive material mounted on its upper surface. These conductive strips connected to the conductive plate are positioned between the quadrants of insulative material to form the conductivity transition border. In other embodiments, multiple parallel strips or a single dot of conductive material are surrounded by insulative material.Type: GrantFiled: March 1, 1990Date of Patent: October 29, 1991Assignee: Applied Precision, Inc.Inventors: John P. Stewart, Ronald C. Seubert, Donald B. Snow
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Patent number: 4918374Abstract: A method and apparatus for inspecting integrated circuit probe cards in which the probe points of the probe card are scanned across a checkplate having a conductivity transition border. The impedances between the probe points and the checkplate as they cross the conductivity transition border are measured to determine when the probe points cross the border. The positions of the probe card when each of the probe points crosses the border are measured to determine the positions of the probe points relative to each other. In one embodiment, the checkplate is formed by a square conductive plate having three quadrants of insulated material and a single quadrant of conductive material mounted on its upper surface. These conductive strips connected to the conductive plate are positioned between the quadrants of insulative material to form the conductivity transition border. In other embodiments, multiple parallel strips or a single dot of conductive material are surrounded by insulative material.Type: GrantFiled: October 5, 1988Date of Patent: April 17, 1990Assignee: Applied Precision, Inc.Inventors: John P. Stewart, Ronald C. Seubert, Donald B. Snow
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Patent number: 4718894Abstract: The invention concerns a sequential and manually actuated feed device for implantation in an accessible subcutaneous region of a patient for the purpose of sequentially dosing a liquid, in particular a therapeutant. This device comprises a reservoir consisting of a flexible pouch, a filling site (2) located at the rim of said pouch in order to inject the liquid into it, and a manual pump (3) located in the opposite zone of the pouch in order to supply the liquid dose by dose to a catheter (20). The pump has a rigid case with a recess and bearing an expulsion membrane so as to bound a volume chamber; safety means prevent any accidental injection in the event of a spurious pressure exerted on the flexible pouch.Type: GrantFiled: May 21, 1986Date of Patent: January 12, 1988Assignee: Applied Precision LimitedInventor: Guy Lazorthes
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Patent number: 4710167Abstract: The invention concerns a device to be implanted in an accessible subcutaneous zone of the body of a patient in order to constitute a chronic injection site of a liquid, in particular a therapeutant. This device includes an injection chamber (12) bounded by an integral rigid case (11) provided for that purpose with a recess of rounded, concave shape; the case (11) is provided around the recess with a rim (13) on which is impermeably fixed the rim of an elastic membrane (14) which in its rest state is essentially plane. A catheter (17) is connected to the injection chamber (12) and issues into the deepest part of the recess forming this chamber.Type: GrantFiled: May 21, 1986Date of Patent: December 1, 1987Assignee: Applied Precision LimitedInventor: Guy Lazorthes