Abstract: Seeker optics and a related method comprising: an objective for collecting and transmitting light from a target; at least one scattering surface; and a photo detector; wherein: the light transmitted from the objective at small off-boresight target angles propagates to and impinges upon the photo detector without impinging upon the scattering surface; the light transmitted from the objective at large off-boresight target angles propagates to, impinges upon and scatters upon the scattering surface; and the light scattered by the scattering surface propagates to and impinges upon the photo detector; whereby: the target may be detected and tracked at both small and large off-boresight angles, in a wide field of regard.

Abstract: An interferometry method and associated system and computerized media for testing samples under test including those with high aberrations, comprising: situating a sample under test between a tilt mirror and a reference mirror, the tilt mirror tiltable with at least one degree of freedom about at least one tilt mirror axis, and further translatable along an axial line defined by a direction of propagation of a test wavefront from a source thereof; propagating the test wavefront toward the tilt mirror; after the test wavefront has been reflected by the tilt mirror, further propagating the test wavefront toward a reference mirror; and deriving a substantially complete first-tilt-alignment wavefront metrology of the sample under test from a plurality of first-tilt-alignment interferograms taken with the tilt mirror held fixed at a first predetermined tilt mirror angle while discreetly varying a displacement between the sample under test and the reference mirror.

Abstract: A system and related method for coded aperture sensing, comprising: passing at least one scene wavefront from a target scene through at least one original coded aperture mask onto a focal plane array, producing a diffracted projection of the target scene; and processing the diffracted projection into a representation of the target scene by correlating a function of the diffracted projection with a function of a known array pattern of the at least one original coded aperture mask and by using at least one reconstructing wavefront for holographic reconstructing.

Abstract: Disclosed herein is an interferometry device and associated method and computerized media for testing optical components including those with high aberrations, comprising: situating an optical component under test between a source of a spherical test wavefront and a reference mirror; propagating a spherical test wavefront, whereby an axial line is defined by a direction of propagation of said wavefront; deriving a substantially complete first-tilt-alignment wavefront metrology of the optical component under test from a plurality of first-tilt-alignment interferograms obtained with the optical component under test held fixed at a first predetermined tilt angle relative to a direction of propagation of said wavefront; and varying an axial displacement between the optical component under test and the spherical reference mirror to obtain each first-tilt-alignment interferogram. By varying the tilt angle, one can also derive a substantially complete surface metrology of the optical component under test.

Abstract: Disclosed herein is an interferometry device and associated method and computerized media for testing optical components including those with high aberrations, comprising: situating an optical component under test between a source of a spherical test wavefront and a spherical reference mirror; propagating a spherical test wavefront, whereby an axial line is defined by a direction of propagation of said wavefront; deriving a substantially complete first-tilt-alignment wavefront metrology of the optical component under test from a plurality of first-tilt-alignment interferograms obtained with the optical component under test held fixed at a first predetermined tilt angle relative to a direction of propagation of said wavefront; and varying an axial displacement between the optical component under test and the spherical reference mirror to obtain each first-tilt-alignment interferogram. By varying the tilt angle, one can also derive a substantially complete surface metrology of the optical component under test.

Abstract: Optical coherence tomography with 3D coherence scanning is disclosed, using at least three fibers (201, 202, 203) for object illumination and collection of backscattered light. Fiber tips (1, 2, 3) are located in a fiber tip plane (71) normal to the optical axis (72). Light beams emerging from the fibers overlap at an object (122) plane, a subset of intersections of the beams with the plane defining field of view (266) of the optical coherence tomography apparatus. Interference of light emitted and collected by the fibers creates a 3D fringe pattern. The 3D fringe pattern is scanned dynamically over the object by phase shift delays (102, 104) controlled remotely, near ends of the fibers opposite the tips of the fibers, and combined with light modulation. The dynamic fringe pattern is backscattered by the object, transmitted to a light processing system (108) such as a photo detector, and produces an AC signal on the output of the light processing system (108).

Abstract: Optical coherence tomography with 3D coherence scanning is disclosed, using at least three fibers (201, 202, 203) for object illumination and collection of backscattered light. Fiber tips (1, 2, 3) are located in a fiber tip plane (71) normal to the optical axis (72). Light beams emerging from the fibers overlap at an object (122) plane, a subset of intersections of the beams with the plane defining field of view (266) of the optical coherence tomography apparatus. Interference of light emitted and collected by the fibers creates a 3D fringe pattern. The 3D fringe pattern is scanned dynamically over the object by phase shift delays (102, 104) controlled remotely, near ends of the fibers opposite the tips of the fibers, and combined with light modulation. The dynamic fringe pattern is backscattered by the object, transmitted to a light processing system (108) such as a photo detector, and produces an AC signal on the output of the light processing system (108).