Patents Assigned to Araca, Incorporated
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Patent number: 7839496Abstract: The present invention is a sample holder for confocal microscopy of CMP pad samples cut or otherwise removed from either new or used CMP pads that maintains a uniform load and pressure over the part of the sample visible to the confocal microscope by placing the pad behind a transparent window and holding it against the said window by a means comprising upper transparent window retaining means having an offset adjacent the transparent window having the same or essentially the same refractive index as the pad material so that when the pad is held against the transparent window, the edges of the pad are outside the outer edge of the transparent window; lower pad retaining means to press the pad under a known/load against the transparent window, which lower pad retaining means has a size less than the size of the pad; spherical force transmitting means pressed against the lower pad retaining means;, through a load cell to measure the load transferred to the sample through lower pad retaining means, the sphericalType: GrantFiled: April 24, 2008Date of Patent: November 23, 2010Assignee: Araca IncorporatedInventor: Leonard J. Borucki
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Publication number: 20100240283Abstract: [Problem] To improve polishing efficiency while lowering shear force added to semiconductor wafers while increasing polishing speed, without damaging the wafer's processing surface or the membrane under it. [Solution Method] Pressing the revolving head or carrier 34 that holds fixed the semiconductor wafer 10 to the polishing pad or polishing cloth 30 attached to rotating polishing table 32 in this CMP device and while rotating carrier 34 and polishing table 32 respectively, and supplying liquid slurry to polishing pad 30 from nozzle 36, planarization by chemical processes and mechanical processes is carried out by removing membranes of the lower face of semiconductor wafer 10 (the processing surface). The chemical mechanical polishing process of the present invention in regard to the size of the relationship between the rotation rate of semiconductor wafer 10 fW and the number of rotations of polishing pad 30 fP has 3 fp<fW as its lower limit and 4 fp<fW<8 fp is ideal conditions.Type: ApplicationFiled: September 25, 2009Publication date: September 23, 2010Applicants: ARACA Incorporation, Tokyo Electron Limited, Tohoku UniversityInventors: Takenao Nemoto, Tadahiro Ohmi, Akinobu Teramoto, Xun Gu, Ara Philipossian, Yasa Sampurno
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Publication number: 20100203811Abstract: The present invention is a method and apparatus for accelerated pulling and fracturing of aggressive diamonds on a CMP diamond conditioner disc wherein aggressive diamonds of known position are pulled or fractured by contacting the diamond conditioner disc to a plate or sheet of a hard material or a plate or sheet containing discrete structures of hard material relative to which the diamond disc is in motion at a determinable and reproducible rate for a determinable and reproducible period of time and the number and position of the pulled or fractured aggressive diamonds are determined following the completion of said contact.Type: ApplicationFiled: February 9, 2009Publication date: August 12, 2010Applicant: ARACA IncorporatedInventors: Ara Philipossian, Yasa Sampurno, Yun Zhuang
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Patent number: 7727052Abstract: The present invention offers a device for rendering CMP polishing pads easily and temporarily removable from and replaceable upon the platen of a CMP polishing apparatus comprising two sheets, the upper sheet attached to the said CMP polishing pad and the lower attached to the said platen, the said two sheets held together by pegs, pins or protrusions fitted to matching holes in the upper surface of the lower sheet and the lower surface of the upper sheet, said pegs or pins attached to either the upper or lower sheet and able to enter the hold on the adjoining sheet when the sheets are brought together and hold the sheets together by means of the sliding friction attendant upon a tight fit with the said holes. The device allows far easier metrology and storage of CMP polishing pads at different stages of use with no damage to the CMP pad, which may be put back into service at any time.Type: GrantFiled: November 9, 2007Date of Patent: June 1, 2010Assignee: Araca IncorporatedInventor: Leonard J. Borucki
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Patent number: 7410411Abstract: The invention relates to a method for determining the number of active diamonds on a conditioning disk. In particular, the method comprises (a) contacting a diamond conditioner disk with a hard surface, wherein the diamond-containing side of the diamond conditioning disk is facing the hard surface, (b) moving the diamond conditioner disk under a load across the hard surface so as to cause any active diamonds present on the diamond-containing side of the diamond conditioner disk to leave a mark corresponding to each active diamond, and (c) counting the marks to determine the number of active diamonds on the diamond conditioner disk.Type: GrantFiled: September 28, 2006Date of Patent: August 12, 2008Assignees: Araca, Incorporated, Mitsubishi Materials CorporationInventors: Leonard Borucki, Naoki S. Rikita
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Publication number: 20080078231Abstract: The invention relates to a method for determining the number of active diamonds on a conditioning disk. In particular, the method comprises (a) contacting a diamond conditioner disk with a hard surface, wherein the diamond-containing side of the diamond conditioning disk is facing the hard surface, (b) moving the diamond conditioner disk under a load across the hard surface so as to cause any active diamonds present on the diamond-containing side of the diamond conditioner disk to leave a mark corresponding to each active diamond, and (c) counting the marks to determine the number of active diamonds on the diamond conditioner disk.Type: ApplicationFiled: September 28, 2006Publication date: April 3, 2008Applicants: Araca, Incorporated, Mitsubishi Materials CorporationInventors: Leonard Borucki, Naoki S. Rikita