Patents Assigned to ARIS TECHNOLOGY LLC
  • Patent number: 12460921
    Abstract: A metrology three-dimensional (3D) scanning system includes a metrology 3D scanning application (app) comprising computing instructions that, when executed by one or more processors, causing the one or more processors to: record human-robot interaction (HRI) data as a human operator operates the HRI device; generate a preliminary scan path based on the HRI data for operating a robotic element within an operating environment; move the robotic element along at least a portion of the preliminary scan path and record preliminary scan data comprising at least a subset of dimension data defining at least a target object; generate a metrology scanning path plan and a motion plan for the robotic element based on the preliminary scan data; and execute instructions to move the robotic element within the operating environment according to the metrology scanning path plan and the motion plan for scanning the target object.
    Type: Grant
    Filed: March 14, 2023
    Date of Patent: November 4, 2025
    Assignee: ARIS TECHNOLOGY LLC
    Inventors: Mingu Kang, Levi Armstrong, Matthew M. Robinson, Marc Alban, Brad Johnson, James Clark