Abstract: A modular X-ray computed tomography (XCT) system having a higher degree of modularity provides experimental versatility and in situ capabilities. The modular XCT system includes interchangeable X-ray sources and detectors that allow for the XCT system to be readily adapted to different imaging tasks, such as those that may require different trade-offs between spatial resolution, exposure time, power, and other scanning parameters.

Abstract: Instruction issue circuits are disclosed that are configured to issue multiple instructions within a superscalar pipeline of a microprocessor. The instruction issue circuit includes an instruction queue that stores instructions. A ready generation circuit is operably associated with the instruction queue and generates ready signals that indicate which instructions in the instruction queue are ready for execution. To simplify the instruction issue circuit, the instruction issue circuit has group blocks. Each group block receives a different group of the ready signals corresponding to a different group of the instructions. Each group block generates a group output indicating a group set within the corresponding group of the instructions that has a highest instruction execution priority and are ready for execution. By splitting the ready signals into groups, the groups of ready signals can be processed in parallel thereby reducing both the resulting delay and complexity of the instruction issue circuit.

Abstract: Circuitry that includes static random access memory (SRAM) access circuitry and a group of SRAM memory cells is disclosed. A digital fingerprint of the group of SRAM memory cells is determined by using the SRAM access circuitry to force at least a portion of the group of SRAM memory cells into a metastable state and then releasing the portion of the SRAM memory cells. Each SRAM memory cell that was released then selects one of two stable states and the SRAM access circuitry provides a selection profile based on the selections. The digital fingerprint is based on the selection profile.