Patents Assigned to ARKITE NV
  • Patent number: 11688141
    Abstract: A configuration tool adapted to configure a quality control system to monitor and/or guide an operator in a working environment through recognition of objects, events or an operational process, comprises: a volumetric sensor adapted to capture volumetric image frames of the working environment while an object, event or operational process is demonstrated; a display, coupled to the volumetric sensor and configured to live display the volumetric image frames; and a processor configured to: generate a user interface in overlay of the volumetric image frames to enable a user to define a layout zone; and automatically generate a virtual box in the layout zone when an object, event or operational process is detected during demonstration of the object, event or operational process.
    Type: Grant
    Filed: December 29, 2021
    Date of Patent: June 27, 2023
    Assignee: ARKITE NV
    Inventor: Ives De Saeger
  • Patent number: 11244507
    Abstract: A configuration tool adapted to configure a quality control system to monitor and/or guide an operator in a working environment through recognition of objects, events or an operational process, comprises: a volumetric sensor adapted to capture volumetric image frames of the working environment while an object, event or operational process is demonstrated; a display, coupled to the volumetric sensor and configured to live display the volumetric image frames; and a processor configured to: generate a user interface in overlay of the volumetric image frames to enable a user to define a layout zone; and automatically generate a virtual box in the layout zone when an object, event or operational process is detected during demonstration of the object, event or operational process.
    Type: Grant
    Filed: February 13, 2018
    Date of Patent: February 8, 2022
    Assignee: ARKITE NV
    Inventor: Ives De Saeger