Abstract: A system for performing electronic burn-in testing of a component comprising a rack (20) which is electrically connectable to a power source. A tray (50) is on the rack and a mother board (MB) associated with the tray is electrically connectable to the rack. A daughter board (DB) is electrically connectable to the mother board and to a component to be tested. The daughter board is electrically dedicated to the component but neither the tray nor the mother board are dedicated to the component.
Type:
Grant
Filed:
April 2, 1985
Date of Patent:
January 13, 1987
Assignee:
Artronics Corporation
Inventors:
Anthony Santomango, Nicholas N. Hatheway, Jr.
Abstract: A system for performing electronic burn-in testing of a component comprising a rack (20) which is electrically connectable to a power source. A tray (50) is on the rack and a mother board (MB) associated with the tray is electrically connectable to the rack. A daughter board (DB) is electrically connectable to the mother board and to a component to be tested. The daughter board is electrically dedicated to the component but neither the tray nor the mother board are dedicated to the component.
Type:
Grant
Filed:
April 2, 1985
Date of Patent:
January 13, 1987
Assignee:
Artronics Corporation
Inventors:
Anthony Santomango, Nicholas N. Hatheway, Jr.
Abstract: A system for performing electronic burn-in testing of a component comprising a rack (20) which is electrically connectable to a power source. A tray (50) is on the rack and a mother board (MB) associated with the tray is electrically connectable to the rack. A daughter board (DB) is electrically connectable to the mother board and to a component to be tested. The daughter board is electrically dedicated to the component but neither the tray nor the mother board are dedicated to the component.
Type:
Grant
Filed:
January 4, 1982
Date of Patent:
September 17, 1985
Assignee:
Artronics Corporation
Inventors:
Anthony Santomango, Nicholas N. Hatheway, Jr.