Abstract: An optical probe for splitting a beam of light into multiple beams. The optical probe may comprise a first polarizing beam splitter having a first polarization axis, a second polarizing beam splitter having a second polarization axis orthogonal to the first polarization axis, a first half wave plate and a second half wave plate, and optionally a first birefringent phase plate, and a second birefringent phase plate. The first half wave plate may be located before first polarizing beam splitter, and the second half wave plate may be located after the first polarizing beam splitter, relative to the propagation of the light beam. The optical probe may further include a lens for collimating the four light beams. A profilometer includes the optical probe for splitting a beam of light into four light beams, and a scanner for traversing the optical probe over a surface of an element to be measured.

Abstract: An optical probe for splitting a beam of light into multiple beams. The optical probe may comprise a first polarizing beam splitter having a first polarization axis, a second polarizing beam splitter having a second polarization axis orthogonal to the first polarization axis, a first half wave plate and a second half wave plate, and optionally a first birefringent phase plate, and a second birefringent phase plate. The first half wave plate may be located before first polarizing beam splitter, and the second half wave plate may be located after the first polarizing beam splitter, relative to the propagation of the light beam. The optical probe may further include a lens for collimating the four light beams. A profilometer includes the optical probe for splitting a beam of light into four light beams, and a scanner for traversing the optical probe over a surface of an element to be measured.

Abstract: A multiplexing spectrometer measures at least one parameter, such as temperature, pressure or stress. The system multiplexes the outputs of Bragg stack sensors deposited at the distant ends of optical fibers brought in contact or in close proximity to objects. The spectrometer detects the peaks of the optical signals returned from the Bragg stacks and converts them into corresponding values of the parameters of interest. The spectrometer includes an optical system that comprises an entrance slit, a diffraction grating as a light dispersing means. Multiplexing occurs on a two-dimensional solid state matrix photo detector detects and converts the light signals returned from the Bragg stack sensing elements into corresponding electrical signals, and a built-in look-up table to provides the values of the parameters of interest that correspond the spectral characteristics of the returned light signals.