Abstract: A method for determining a stack configuration for a substrate subjected to a patterning process. The method includes obtaining (i) measurement data of a stack configuration with location information on a printed substrate, (ii) a substrate model configured to predict a stack characteristic based on a location of the substrate, and (iii) a stack map including a plurality of stack configurations based on the substrate model. The method iteratively determines values of model parameters of the substrate model based on a fitting between the measurement data and the plurality of stack configurations of the stack map, and predicts an optimum stack configuration at a particular location based on the substrate model using the values of the model parameters.

Abstract: A unit for the collection, cleaning and calibration of electrolysis pots and, in particular, of anodic orifices thereof, as the anodes of an installation for the production of aluminum by igneous electrolysis are replaced, includes two buckets hinge-mounted at the level of a lower end of a shovel-bearing chassis which is vertically movable. The lower edge of each of the buckets is movable in a circular direction by a connecting rod assembly. Also the shovel-bearing chassis is joined to a vertical guide mast and is mechanically linked to the buckets-supporting chassis. The buckets-supporting chassis is moveable relative to the shovel-bearing chassis and integrates the connecting rod assembly for closing and opening the buckets with the buckets being hinge-mounted at the lower end of the buckets-supporting chassis.