Patents Assigned to ASML Lithography B.V.
  • Patent number: 6927403
    Abstract: There is provided an illumination system for wavelengths of ?193 nm. The illumination system includes an object plane, a plane conjugated to the object plane, a first collector between the object plane and the conjugated plane, and a second collector after the conjugated plane. The first collector focuses a beam bundle of rays from the object plane in the conjugated plane. At least one of the first and second collectors includes a mirror shell. The rays strike the mirror shell at an angle of incidence of less than 20° relative to a surface tangent of the mirror shell.
    Type: Grant
    Filed: August 9, 2002
    Date of Patent: August 9, 2005
    Assignees: Carl Zeiss SMT AG, ASML Lithography B.V.
    Inventors: Wolfgang Singer, Martin Antoni, Johannes Wangler, Wilhelm Egle, Vadim Yevgenyevich Banine, Erik Roelof Loopstra
  • Patent number: 5986742
    Abstract: A lithographic scanning exposure projection apparatus is provided with a radiation source (1) providing radiation pulses, a lens system (3, 7), a mask (5), imaged onto a substrate (9) and scanning apparatus (10) for scanning an image of an exit window (2) of the radiation source at a scanning speed over the substrate (9). A controller (13) controls both the energy of the radiation pulses and the scanning speed in dependence on the required exposure dose on the substrate and the repetition rate of the radiation pulses. The controller ensures maximum throughput of substrates through the apparatus and a minimum dose non-uniformity on the substrates.
    Type: Grant
    Filed: March 27, 1997
    Date of Patent: November 16, 1999
    Assignee: ASML Lithography B.V.
    Inventors: Alexander Straaijer, Ronald A. M. De Jager