Patents Assigned to Aspectrics, Inc.
  • Patent number: 7466468
    Abstract: A two dimensional spatial radiation modulator rotated about a rotation axis to modulate components of an incident radiation beam to encode the beam. The modulator includes sub-regions in a first annular segment being patterned to form a pair of radiation filters having substantially complementary modulation functions. The pair of radiation filters produces a first encoded component with a characteristic determined by the relative intensities of radiation from the beam incident on the pair of filters. The modulator also includes sub-regions in a second annular segment being patterned to form a filter that produces a second encoded component with a characteristic determined by the total intensity of radiation from the beam incident on the filter.
    Type: Grant
    Filed: October 26, 2007
    Date of Patent: December 16, 2008
    Assignee: Aspectrics, Inc.
    Inventor: Thomas W. Hagler
  • Patent number: 7430044
    Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An encoder spectrograph may be used wherein the first optics comprises a diffraction grating that is optimized for an annular-shaped intercept between the dispersed image and the radiation filters on a modulator.
    Type: Grant
    Filed: August 3, 2007
    Date of Patent: September 30, 2008
    Assignee: Aspectrics, Inc.
    Inventor: Thomas W. Hagler
  • Patent number: 7426446
    Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. A spectra sorting algorithm is used to determine calibration training spectra for a spectrometer in a spectrometer calibration training mode.
    Type: Grant
    Filed: August 3, 2007
    Date of Patent: September 16, 2008
    Assignee: Aspectrics, Inc.
    Inventor: Thomas W. Hagler
  • Publication number: 20080218752
    Abstract: A chemometric analyzer for analyzing a plurality of analytes. The analyzer disperses radiation by wavelength along an encoding axis. The analyzer includes a spatial radiation modulator having a plurality of radiation filters. Each radiation filter modulates the intensity of a corresponding spectral component in the radiation.
    Type: Application
    Filed: October 26, 2007
    Publication date: September 11, 2008
    Applicant: Aspectrics, Inc.
    Inventor: Thomas W. Hagler
  • Patent number: 7423749
    Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An encoded photometric infrared spectroscopy (“EPIR”) analyzer employs orthogonal encoded components having substantially identical modulation frequencies, which may allow for the multiplexing of up to twice as many encoded components.
    Type: Grant
    Filed: August 3, 2007
    Date of Patent: September 9, 2008
    Assignee: Aspectrics, Inc.
    Inventor: Thomas W. Hagler
  • Patent number: 7423748
    Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An encoder spectrograph includes a modulator with radiation filters having non-equal widths and centered at non-equal intervals along the encoding axis of the modulator.
    Type: Grant
    Filed: August 3, 2007
    Date of Patent: September 9, 2008
    Assignee: Aspectrics, Inc.
    Inventor: Thomas W. Hagler
  • Patent number: 7420673
    Abstract: A method of generating a design pattern for a spatial radiation modulator to encode two or more selected spectral components in one or more spectral ranges for the chemometric analysis of a group of analytes. The method includes obtaining a corresponding spectrum for each of the analytes, defining a set of initial spectral windows, constructing a chemometric matrix to relate concentrations of the analytes to intensities of the spectral components, deriving optimized spectral windows, and translating the center wavelength and the bandwidth of each of the optimized spectral windows into a corresponding optimized annular region on the modulator.
    Type: Grant
    Filed: October 26, 2007
    Date of Patent: September 2, 2008
    Assignee: Aspectrics, Inc.
    Inventor: Thomas W. Hagler
  • Publication number: 20080100836
    Abstract: A method of generating a design pattern for a spatial radiation modulator to encode two or more selected spectral components in one or more spectral ranges for the chemometric analysis of a group of analytes. The method includes obtaining a corresponding spectrum for each of the analytes, defining a set of initial spectral windows, constructing a chemometric matrix to relate concentrations of the analytes to intensities of the spectral components, deriving optimized spectral windows, and translating the center wavelength and the bandwidth of each of the optimized spectral windows into a corresponding optimized annular region on the modulator.
    Type: Application
    Filed: October 26, 2007
    Publication date: May 1, 2008
    Applicant: Aspectrics, Inc.
    Inventor: Thomas Hagler
  • Publication number: 20080043314
    Abstract: A two dimensional spatial radiation modulator rotated about a rotation axis to modulate components of an incident radiation beam to encode the beam. The modulator includes sub-regions in a first annular segment being patterned to form a pair of radiation filters having substantially complementary modulation functions. The pair of radiation filters produces a first encoded component with a characteristic determined by the relative intensities of radiation from the beam incident on the pair of filters. The modulator also includes sub-regions in a second annular segment being patterned to form a filter that produces a second encoded component with a characteristic determined by the total intensity of radiation from the beam incident on the filter.
    Type: Application
    Filed: October 26, 2007
    Publication date: February 21, 2008
    Applicant: Aspectrics, Inc.
    Inventor: Thomas Hagler
  • Patent number: 7330253
    Abstract: Method and apparatus for analyzing radiation using analyzers and encoders employing the spatial modulation of radiation dispersed by wavelength or imaged along a line.
    Type: Grant
    Filed: November 30, 2005
    Date of Patent: February 12, 2008
    Assignee: Aspectrics, Inc.
    Inventor: Thomas W. Hagler
  • Publication number: 20070273876
    Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An encoder spectrograph includes a modulator with radiation filters having non-equal widths and centered at non-equal intervals along the encoding axis of the modulator.
    Type: Application
    Filed: August 3, 2007
    Publication date: November 29, 2007
    Applicant: Aspectrics, Inc.
    Inventor: Thomas Hagler
  • Publication number: 20070271055
    Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. A spectra sorting algorithm is used to determine calibration training spectra for a spectrometer in a spectrometer calibration training mode.
    Type: Application
    Filed: August 3, 2007
    Publication date: November 22, 2007
    Applicant: Aspectrics, Inc.
    Inventor: Thomas Hagler
  • Publication number: 20070268486
    Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An encoder spectrograph may be used wherein the first optics comprises a diffraction grating that is optimized for an annular-shaped intercept between the dispersed image and the radiation filters on a modulator.
    Type: Application
    Filed: August 3, 2007
    Publication date: November 22, 2007
    Applicant: Aspectrics, Inc.
    Inventor: Thomas Hagler
  • Publication number: 20070268487
    Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An EPIR analyzer employs orthogonal encoded components having substantially identical modulation frequencies, which may allow for the multiplexing of up to twice as many encoded components.
    Type: Application
    Filed: August 3, 2007
    Publication date: November 22, 2007
    Applicant: Aspectrics, Inc.
    Inventor: Thomas Hagler
  • Patent number: 7262846
    Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator.
    Type: Grant
    Filed: June 28, 2005
    Date of Patent: August 28, 2007
    Assignee: Aspectrics, Inc.
    Inventor: Thomas W. Hagler
  • Patent number: 6999165
    Abstract: Method and apparatus for analyzing radiation using analyzers and encoders employing the spatial modulation of radiation dispersed by wavelength or imaged along a line.
    Type: Grant
    Filed: May 3, 2001
    Date of Patent: February 14, 2006
    Assignee: Aspectrics, Inc.
    Inventor: Thomas W. Hagler
  • Patent number: 6995840
    Abstract: Method and apparatus for analyzing radiation using analyzers and encoders employing the spatial modulation of radiation dispersed by wavelength or imaged along a line.
    Type: Grant
    Filed: March 6, 2003
    Date of Patent: February 7, 2006
    Assignee: Aspectrics, Inc.
    Inventor: Thomas W. Hagler
  • Patent number: 6982788
    Abstract: A disc serving as a spatial radiation modulator has dispersed radiation filters thereon. Each filter has a transmittance or reflectance modulation function of the form sin2(m?+p?/4), where m is a positive integer and p has one of the four values 0, 1, 2, 3. A radiation beam including selected wavelength components is diffracted into an elongated image dispersed according to wavelength. Different wavelength components are focused onto different filters on the modulator and are encoded by correspond filters. Since the modulation functions of the filters are orthogonal to one another, it is possible to extract the amplitude of each wavelength component after it has been encoded or modulated by corresponding filter from the total detected signal during one measurement.
    Type: Grant
    Filed: June 4, 2004
    Date of Patent: January 3, 2006
    Assignee: Aspectrics, Inc.
    Inventor: Thomas W. Hagler