Patents Assigned to Aspectrics, Inc.
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Patent number: 7466468Abstract: A two dimensional spatial radiation modulator rotated about a rotation axis to modulate components of an incident radiation beam to encode the beam. The modulator includes sub-regions in a first annular segment being patterned to form a pair of radiation filters having substantially complementary modulation functions. The pair of radiation filters produces a first encoded component with a characteristic determined by the relative intensities of radiation from the beam incident on the pair of filters. The modulator also includes sub-regions in a second annular segment being patterned to form a filter that produces a second encoded component with a characteristic determined by the total intensity of radiation from the beam incident on the filter.Type: GrantFiled: October 26, 2007Date of Patent: December 16, 2008Assignee: Aspectrics, Inc.Inventor: Thomas W. Hagler
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Patent number: 7430044Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An encoder spectrograph may be used wherein the first optics comprises a diffraction grating that is optimized for an annular-shaped intercept between the dispersed image and the radiation filters on a modulator.Type: GrantFiled: August 3, 2007Date of Patent: September 30, 2008Assignee: Aspectrics, Inc.Inventor: Thomas W. Hagler
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Patent number: 7426446Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. A spectra sorting algorithm is used to determine calibration training spectra for a spectrometer in a spectrometer calibration training mode.Type: GrantFiled: August 3, 2007Date of Patent: September 16, 2008Assignee: Aspectrics, Inc.Inventor: Thomas W. Hagler
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Publication number: 20080218752Abstract: A chemometric analyzer for analyzing a plurality of analytes. The analyzer disperses radiation by wavelength along an encoding axis. The analyzer includes a spatial radiation modulator having a plurality of radiation filters. Each radiation filter modulates the intensity of a corresponding spectral component in the radiation.Type: ApplicationFiled: October 26, 2007Publication date: September 11, 2008Applicant: Aspectrics, Inc.Inventor: Thomas W. Hagler
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Patent number: 7423749Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An encoded photometric infrared spectroscopy (“EPIR”) analyzer employs orthogonal encoded components having substantially identical modulation frequencies, which may allow for the multiplexing of up to twice as many encoded components.Type: GrantFiled: August 3, 2007Date of Patent: September 9, 2008Assignee: Aspectrics, Inc.Inventor: Thomas W. Hagler
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Patent number: 7423748Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An encoder spectrograph includes a modulator with radiation filters having non-equal widths and centered at non-equal intervals along the encoding axis of the modulator.Type: GrantFiled: August 3, 2007Date of Patent: September 9, 2008Assignee: Aspectrics, Inc.Inventor: Thomas W. Hagler
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Patent number: 7420673Abstract: A method of generating a design pattern for a spatial radiation modulator to encode two or more selected spectral components in one or more spectral ranges for the chemometric analysis of a group of analytes. The method includes obtaining a corresponding spectrum for each of the analytes, defining a set of initial spectral windows, constructing a chemometric matrix to relate concentrations of the analytes to intensities of the spectral components, deriving optimized spectral windows, and translating the center wavelength and the bandwidth of each of the optimized spectral windows into a corresponding optimized annular region on the modulator.Type: GrantFiled: October 26, 2007Date of Patent: September 2, 2008Assignee: Aspectrics, Inc.Inventor: Thomas W. Hagler
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Publication number: 20080100836Abstract: A method of generating a design pattern for a spatial radiation modulator to encode two or more selected spectral components in one or more spectral ranges for the chemometric analysis of a group of analytes. The method includes obtaining a corresponding spectrum for each of the analytes, defining a set of initial spectral windows, constructing a chemometric matrix to relate concentrations of the analytes to intensities of the spectral components, deriving optimized spectral windows, and translating the center wavelength and the bandwidth of each of the optimized spectral windows into a corresponding optimized annular region on the modulator.Type: ApplicationFiled: October 26, 2007Publication date: May 1, 2008Applicant: Aspectrics, Inc.Inventor: Thomas Hagler
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Publication number: 20080043314Abstract: A two dimensional spatial radiation modulator rotated about a rotation axis to modulate components of an incident radiation beam to encode the beam. The modulator includes sub-regions in a first annular segment being patterned to form a pair of radiation filters having substantially complementary modulation functions. The pair of radiation filters produces a first encoded component with a characteristic determined by the relative intensities of radiation from the beam incident on the pair of filters. The modulator also includes sub-regions in a second annular segment being patterned to form a filter that produces a second encoded component with a characteristic determined by the total intensity of radiation from the beam incident on the filter.Type: ApplicationFiled: October 26, 2007Publication date: February 21, 2008Applicant: Aspectrics, Inc.Inventor: Thomas Hagler
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Patent number: 7330253Abstract: Method and apparatus for analyzing radiation using analyzers and encoders employing the spatial modulation of radiation dispersed by wavelength or imaged along a line.Type: GrantFiled: November 30, 2005Date of Patent: February 12, 2008Assignee: Aspectrics, Inc.Inventor: Thomas W. Hagler
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Publication number: 20070273876Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An encoder spectrograph includes a modulator with radiation filters having non-equal widths and centered at non-equal intervals along the encoding axis of the modulator.Type: ApplicationFiled: August 3, 2007Publication date: November 29, 2007Applicant: Aspectrics, Inc.Inventor: Thomas Hagler
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Publication number: 20070271055Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. A spectra sorting algorithm is used to determine calibration training spectra for a spectrometer in a spectrometer calibration training mode.Type: ApplicationFiled: August 3, 2007Publication date: November 22, 2007Applicant: Aspectrics, Inc.Inventor: Thomas Hagler
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Publication number: 20070268486Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An encoder spectrograph may be used wherein the first optics comprises a diffraction grating that is optimized for an annular-shaped intercept between the dispersed image and the radiation filters on a modulator.Type: ApplicationFiled: August 3, 2007Publication date: November 22, 2007Applicant: Aspectrics, Inc.Inventor: Thomas Hagler
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Publication number: 20070268487Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An EPIR analyzer employs orthogonal encoded components having substantially identical modulation frequencies, which may allow for the multiplexing of up to twice as many encoded components.Type: ApplicationFiled: August 3, 2007Publication date: November 22, 2007Applicant: Aspectrics, Inc.Inventor: Thomas Hagler
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Patent number: 7262846Abstract: An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator.Type: GrantFiled: June 28, 2005Date of Patent: August 28, 2007Assignee: Aspectrics, Inc.Inventor: Thomas W. Hagler
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Patent number: 6999165Abstract: Method and apparatus for analyzing radiation using analyzers and encoders employing the spatial modulation of radiation dispersed by wavelength or imaged along a line.Type: GrantFiled: May 3, 2001Date of Patent: February 14, 2006Assignee: Aspectrics, Inc.Inventor: Thomas W. Hagler
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Patent number: 6995840Abstract: Method and apparatus for analyzing radiation using analyzers and encoders employing the spatial modulation of radiation dispersed by wavelength or imaged along a line.Type: GrantFiled: March 6, 2003Date of Patent: February 7, 2006Assignee: Aspectrics, Inc.Inventor: Thomas W. Hagler
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Patent number: 6982788Abstract: A disc serving as a spatial radiation modulator has dispersed radiation filters thereon. Each filter has a transmittance or reflectance modulation function of the form sin2(m?+p?/4), where m is a positive integer and p has one of the four values 0, 1, 2, 3. A radiation beam including selected wavelength components is diffracted into an elongated image dispersed according to wavelength. Different wavelength components are focused onto different filters on the modulator and are encoded by correspond filters. Since the modulation functions of the filters are orthogonal to one another, it is possible to extract the amplitude of each wavelength component after it has been encoded or modulated by corresponding filter from the total detected signal during one measurement.Type: GrantFiled: June 4, 2004Date of Patent: January 3, 2006Assignee: Aspectrics, Inc.Inventor: Thomas W. Hagler