Abstract: A network of storage units has a data path which is at least a portion of the network. The network also has a key storage unit and a gateway storage unit. If the key storage unit stores a key value, the key storage unit transmits a key signal to the gateway storage unit. If the gateway storage unit does not store a gateway value or the key signal is not transmitted to the gateway storage unit, the gateway storage unit does not insert a data path segment in the data path. If the gateway storage unit stores a gateway value and the key signal is transmitted to the gateway storage unit, the gateway storage unit inserts the data path segment.

Abstract: A system and method of debugging application software operating on a system-on-chip processor (SOC) with a system trace macrocell.

Abstract: A network of storage units has a data path which is at least a portion of the network. The network also has a key storage unit and a gateway storage unit. If the key storage unit stores a key value, the key storage unit transmits a key signal to the gateway storage unit. If the gateway storage unit does not store a gateway value or the key signal is not transmitted to the gateway storage unit, the gateway storage unit does not insert a data path segment in the data path. If the gateway storage unit stores a gateway value and the key signal is transmitted to the gateway storage unit, the gateway storage unit inserts the data path segment.

Abstract: A graphical user interface (GUI) that configures a test for a circuit. More particularly, the circuit includes a built-in-self-test (BIST) compatible device and has a test configuration. The device has an associated value. Moreover, the circuit, the device, and the associated value are defined in a circuit definition. The GUI includes a GUI object representing the circuit, a GUI object representing the BIST compatible device, and a GUI object representing the associated value. Furthermore, at least one of the GUI objects is configured to allow a modification to the GUI object and to reconfigure the test configuration in response to the GUI object modification. Also, the GUI object is further configured to modify itself to reflect a modification of the circuit definition. More particularly, the device may be an interconnect built-in self-test (IBIST) compatible device having registers, ports and lanes of the ports.

Abstract: Methods and apparatus for performing a data driven test on a circuit including at least one built-in-self-test compatible device. In one embodiment, the method includes describing the device using a descriptive language including setting at least one default value associated with the device. The method also includes defining a scan path associated with the device, defining a netlist of the circuit, and configuring a test control program for the circuit. Additionally, the method includes changing the default value associated with the device. Testing the circuit after changing the value and using the test control program is also included wherein a portion of the test control program associated with the value remains substantially unmodified.

Abstract: Methods and apparatus for performing a data driven test on a circuit including at least one built-in-self-test compatible device. In one embodiment, the method includes describing the device using a descriptive language including setting at least one default value associated with the device. The method also includes defining a scan path associated with the device, defining a netlist of the circuit, and configuring a test control program for the circuit. Additionally, the method includes changing the default value associated with the device. Testing the circuit after changing the value and using the test control program is also included wherein a portion of the test control program associated with the value remains substantially unmodified.

Abstract: A graphic user interface for configuring a test control program for a circuit. More particularly the circuit includes a built-in-self-test compatible device and has a test configuration. The device has an associated value. Moreover, the circuit, the device, and the value are defined in a circuit definition. The interface includes an object representing the circuit, an object representing the device, and an object representing the value. Furthermore, at least one of the objects is configured and adapted to allow a modification to the object and to reconfigure the test configuration program in response to the object modification. Also, the object is further configured and adapted to modify itself to reflect a modification of the circuit definition. More particularly, the device may be an IBIST compatible device having registers, ports and lanes of the ports. Methods of, and computer programs for, configuring test control programs are also provided.