Abstract: A method is provide for measuring electromagnetic radiation radiated from a surface of an object that is irradiated by electromagnetic radiation given off by at least one radiation source. The radiation given off by the radiation source is determined by at least one first detector, and the radiation given off by the irradiated object is determined by at least one second detector that measures the radiation. The radiation from the at least one radiation source is actively modulated with at least one characteristic parameter. The radiation determined by the second detector is corrected with the radiation determined by the first detector to compensate for the radiation of the radiation source reflected from the object.
Type:
Grant
Filed:
December 8, 1998
Date of Patent:
February 20, 2001
Assignee:
Steag AST Elektronik GmbH
Inventors:
Markus Hauf, Thomas Knarr, Heinrich Walk, Horst Balthasar, Uwe Müller
Abstract: A low defect rate is provided in rapid thermal processing of delicate components with reduction of defects caused by inhomogeneities of temperature during a rapid thermal processing. In a suitable system a defect-guarded RTP method is carried out in such a manner that the density of the heating energy is adjusted in consecutive intervals of time, which may be as short as desired, to such automatically controlled limiting values or to such fixed values that in the reaction chamber the difference between the primary and secondary energy densities is almost continuously held at the minimum which is achievable throughout the thermal processing whereas the ramps have predetermined slopes.
Type:
Grant
Filed:
July 14, 1992
Date of Patent:
October 25, 1994
Assignee:
AST elektronik GmbH
Inventors:
Zsolt Nenyei, Thomas Knarr, Heinrich Walk