Abstract: A method for testing a DAC is provided. The method includes controlling the DAC digitally to cause it to produce a known desired analog output, for example a fixed amplitude sine wave; determining the duration of fixed voltage segments of the actual output of the DAC and using the duration of the fixed voltage segments to assess or determine performance of the DAC.
Type:
Grant
Filed:
September 22, 2015
Date of Patent:
July 11, 2017
Assignee:
Ateeda Limited
Inventors:
David Hamilton, Tom Clayton, Gordon Sharp, Ian Stevenson