Patents Assigned to Ateeda LTD
  • CIRCUIT TESTING
    Publication number: 20100328121
    Abstract: A method for testing a circuit that generates an n-bit pulse density modulated output in response to an input signal or combination of input signals, for example the analogue section (12) of an analogue to digital converter (25) that has an n-bit pulse density modulated output stream, the method comprising inputting a test signal to the circuit, converting the pulse density modulated output to an analogue signal and checking the actual analogue output against an expected output, thereby to identify any faults.
    Type: Application
    Filed: March 11, 2009
    Publication date: December 30, 2010
    Applicant: Ateeda LTD
    Inventor: David Hamilton