Abstract: A test probe for a finger tester for the testing of non-componented circuit boards has a test needle with a probe tip which may be brought into contact with a circuit board test point, and which may be pivotably attached to a mount by means of at least two flexible sprung retaining arms. It is distinguished by the fact that at least one of the retaining arms is made of an electrically conductive material and is electrically connected to the test needle. In a corresponding finger tester, the test probe is driven by a linear motor.

Abstract: A method of testing circuit boards, in particular non-componented circuit boards in which the level of the surface of a circuit board to be tested is detected automatically in a contacting process, and the further contacting operations are then controlled on the basis of the level detected. By this process, the control of the movement of the test probes of the finger tester effects automatic matching to the level, which is of particular advantage in the testing of flexible circuit boards, since their surface may have a three-dimensional form.

Abstract: A test probe for a finger tester for the testing of non-componented circuit boards has a test needle with a probe tip which may be brought into contact with a circuit board test point, and which may be pivotably attached to a mount by means of at least two flexible sprung retaining arms. It is distinguished by the fact that at least one of the retaining arms is made of an electrically conductive material and is electrically connected to the test needle. In a corresponding finger tester, the test probe is driven by a linear motor.

Abstract: A test probe for a finger tester for the testing of non-componented circuit boards has a test needle with a probe tip which may be brought into contact with a circuit board test point, and which may be pivotably attached to a mount by means of at least two flexible sprung retaining arms. It is distinguished by the fact that at least one of the retaining arms is made of an electrically conductive material and is electrically connected to the test needle. In a corresponding finger tester, the test probe is driven by a linear motor.

Abstract: A method for examining a circuit board in a predetermined area of the circuit board uses an apparatus that has a stationary camera and a display unit. The circuit board is arranged so as to be freely movable in the scanning zone of the camera. According to the invention, an image of the circuit board recorded by the camera, the camera image, is brought into congruence with a circuit board image, wherein the camera image and the circuit board image, after a first alignment process, are enlarged at least once in the same ratio and then re-aligned. This results in even greater congruence between camera image and circuit board image, and the predetermined area to be examined is marked in this enlarged view. In this way a user of the method according to the invention may rapidly locate the area of the circuit board to be examined, in an enlarged display, and may analyze it accordingly.

Abstract: A test probe for a finger tester for the testing of non-componented circuit boards has a test needle with a probe tip which may be brought into contact with a circuit board test point, and which may be pivotably attached to a mount by means of at least two flexible sprung retaining arms. It is distinguished by the fact that at least one of the retaining arms is made of an electrically conductive material and is electrically connected to the test needle. In a corresponding finger tester, the test probe is driven by a linear motor.

Abstract: An apparatus and a method for the testing of circuit boards, together with a test probe for this apparatus and this method, in which the contact tips of a test finger of a finger tester are monitored during the testing process by an optical detection device and their movement, at least when approaching a part of the circuit board test points of a circuit board to be tested, is corrected on the basis of the result determined by the optical detection device in such a way that the contact tip makes reliable contact with the circuit board test point concerned. The correction data hereby obtained may be used in the calculation of calibration data.

Abstract: A method of testing circuit boards, in particular non-componented circuit boards in which the level of the surface of a circuit board to be tested is detected automatically in a contacting process, and the further contacting operations are then controlled on the basis of the level detected. By this means, the control of the movement of the test probes of the finger tester effects automatic matching to the level, which is of particular advantage in the testing of flexible circuit boards, since their surface may have a three-dimensional form.

Abstract: A test probe for a finger tester for the testing of non-componented circuit boards has a test needle with a probe tip which may be brought into contact with a circuit board test point, and which may be pivotably attached to a mount by means of at least two flexible sprung retaining arms. It is distinguished by the fact that at least one of the retaining arms is made of an electrically conductive material and is electrically connected to the test needle. In a corresponding finger tester, the test probe is driven by a linear motor.

Abstract: An apparatus and a method for the testing of circuit boards, together with a test probe for this apparatus and this method, in which the contact tips of a test finger of a finger tester are monitored during the testing process by an optical detection device and their movement, at least when approaching a part of the circuit board test points of a circuit board to be tested, is corrected on the basis of the result determined by the optical detection device in such a way that the contact tip makes reliable contact with the circuit board test point concerned. The correction data hereby obtained may be used in the calculation of calibration data.

Abstract: A test probe for a finger tester for the testing of non-componented circuit boards has a test needle with a probe tip which may be brought into contact with a circuit board test point, and which may be pivotably attached to a mount by means of at least two flexible sprung retaining arms. It is distinguished by the fact that at least one of the retaining arms is made of an electrically conductive material and is electrically connected to the test needle. In a corresponding finger tester, the test probe is driven by a linear motor.

Abstract: A probe for a circuit board tester as well as to an adapter and a circuit board tester. The probe comprises a needle and a sleeve, the needle being shiftingly guided in the sleeve and the needle protruding at least 10 mm from the sleeve, more particularly more than 20 mm. In one embodiment, the needle is conically tapered to a contact tip at least in a portion protruding from the sleeve. With the probe in accordance with the invention, adapters for circuit boards can be produced comprising contacts in high-density, the probes simultaneously acting resiliently.

Abstract: A circuit board tester includes a contact array, contact fingers arranged for travelling in a plane parallel to the contact array, two contact fingers forming a probe pair as a component of a test current circuit, a controller for positioning the contact fingers on circuit board test points of a circuit board to be tested, the circuit boards being insertable into the tester simultaneously during a test procedure being tested, and two sets of contact fingers, one set being arranged for testing the front side and the other set for testing the rear side of a circuit board to be tested.

Abstract: The test needle has, for contacting a circuit board test point, a contact portion configured conically tapered to a free contact tip. The contact portion has a length of at least 15 mm and at the contact tip a diameter smaller than 0.2 mm. An end section of the contact portion apposite the contact tip comprises a diameter at least 0.1 mm larger than the contact tip. With the test needle in accordance with the invention, extremely dense structures on circuit boards can be strobed. The test needle in accordance with the invention is stiffer than known test needles for strobing comparable structures. This simplifies their handling and the configuration of a pattern adapter incorporating these test needles.

Abstract: A method for examining a circuit board in a predetermined area of the circuit board uses an apparatus that has a stationary camera and a display unit. The circuit board is arranged so as to be freely movable in the scanning zone of the camera. According to the invention, an image of the circuit board recorded by the camera, the camera image, is brought into congruence with a circuit board image, wherein the camera image and the circuit board image, after a first alignment process, are enlarged at least once in the same ratio and then re-aligned. This results in even greater congruence between camera image and circuit board image, and the predetermined area to be examined is marked in this enlarged view. In this way a user of the method according to the invention may rapidly locate the area of the circuit board to be examined, in an enlarged display, and may analyze it accordingly.

Abstract: A circuit board tester includes a contact array, contact fingers arranged for travelling in a plane parallel to the contact array, two contact fingers forming a probe pair as a component of a test current circuit, a controller for positioning the contact fingers on circuit board test points of a circuit board to be tested, the circuit boards being insertable into the tester simultaneously during a test procedure being tested, and two sets of contact fingers, one set being arranged for testing the front side and the other set for testing the rear side of a circuit board to be tested.

Abstract: The test needle comprises, for contacting a circuit board test point, a contact portion configured conically tapered to a free contact tip. The contact portion has a length of at least 15 mm and at the contact tip a diameter smaller than 0.2 mm. An end section of the contact portion opposite the contact tip comprises a diameter at least 0.1 mm larger than the contact tip. With the test needle in accordance with the invention extremely dense structures on circuit boards can be strobed. The test needle in accordance with the invention is stiffer than known test needles for strobing comparable structures. This simplifies their handling and the configuration of a pattern adapter incorporating these test needles.

Abstract: A printed circuit board tester includes an electronic analyzer and a grid pattern of contact points arranged in a regular pattern in a grid pattern plane. The contact points of the grid pattern are electrically connected to the electronic analyzer such that test points of a circuit board can be electrically scanned, whereby several contact points of the grid pattern are electrically interconnected. The circuit board is connectable to the contact points of the grid pattern by an adapter and/or a translator. The tester includes several grid bases, each of which comprises a contact point narrow side surface at which the contact points are arranged. The grid bases are provided with tracks, each of which is electrically connected to several contact points. Each track includes an electrical terminal connection leading to a terminal contact for connecting the electronic analyzer such that several contact points are electrically connected to a terminal contact.

Abstract: A probe for a circuit board tester as well as to an adapter and a circuit board tester. The probe comprises a needle and a sleeve, the needle being shiflingly guided in the sleeve and the needle protruding at least 10 mm from the sleeve, more particularly more than 20 mm. In one embodiment, the needle is conically tapered to a contact tip at least in a portion protruding from the sleeve. With the probe in accordance with the invention, adapters for circuit boards can be produced comprising contacts in high-density, the probes simultaneously acting resiliently.

Abstract: The invention relates to a printed circuit board tester, more particularly for testing large-area non-componented circuit boards, comprising a grid pattern provided with contact points arranged in a predetermined pattern, several contact points in each case being electrically connected to a straight-line scanning channel and an adapter and/or a translator being mounted of said grid pattern, an electronic analyzer electrically connected to said contact points via said scanning channels, a circuit board to be tested to which said adapter and/or said translator may be applied such that said adapter and/or translator produces an electrical contact of said circuit board test points on said circuit board to said contact points of said grid pattern, and a means for electrically connecting at least two scanning channels.