Abstract: The invention relates to a finger tester probe including a probe element for electrically contacting a contact point of a circuit board under test, an actuator including a permanently premagnetized core and a solenoid element. The solenoid element is shiftingly arranged on the permanently premagnetized core and is mechanically connected to the probe element. Upon being energized, the solenoid element is moved together with the probe element. Since in accordance with the invention a movable part of the actuator is not mechanically connected to a fixed part of the actuator, the test probe which is attached to the movable part is able to bring the probe element into contact with a contact point of a circuit board under test at high speed.

Abstract: A circuit board test apparatus comprises a plurality of circuit board test points. The test apparatus is provided with an electronic analyzer comprising a plurality of test connections, each circuit board test point being in contact with a test connection via an electrical connection. The electronic analyzer is electrically connected to a grid pattern, an adapter and/or a translator being mounted on the grid pattern. The adapter and/or translator, on which a circuit board to be tested is to be placed, produces an electrical contact from circuit board test points on the circuit board to contact points of the grid pattern. At least two contact points of the grid pattern are electrically connected to each other.

Abstract: A circuit board test apparatus comprising a plurality of circuit board test points is provided with an electronic analyzer comprising a plurality of test connections, each circuit board test point of the board under test being in contact with a test connection via an electrical connection. At least two of the electrical connections are electrically connected so that at least two circuit board test points of the board under test are in connection with a sole test connection.

Abstract: An electric circuit board tester comprises a contact board (1) configured as a circuit board and contact elements on a testing side, for example its upper side, which can be connected to test points on the circuit board to be tested. The other side of the contact board has contact points (4) electrically connected to the contact elements via conductors (3). Electronic units (8) are releasably secured to the side of the contact board (1) comprising the contact points, such that a physical connection to the contact board (1) and an electrical connection between the electronic units (8) and the contact points (4) are simultaneously achieved.

Abstract: An automated circuit board tester comprises an unstacker (1) arranged upstream of a testing device and which by means of a circuit board picker (40) arranged above a chute (30) picks a top-most circuit board from a stack of circuit boards (55) located in the chute (30). The chute (30) comprises a lifting device including at least two sets of vertically travelling supporting elements (38, 101), each of which is able to carry a stack of circuit boards (55). The chute (30) is open at least on one side so that a set of supporting elements (38, 101) can be loaded while a stack of circuit boards (55) located on the other set of supporting elements (38, 101) is unstacked by the circuit board picker (40).

Abstract: The invention relates to a circuit board testing method, wherein an array of several circuits of a circuit board are short-circuited and further circuits are short-circuit tested by applying a high test voltage relative to said array of circuits, as a result of which the number of tests, which are normally highly time-intensive due to the high voltages, is drastically reduced since the further circuits do not need to be tested discretely relative to each circuit of the circuit array.

Abstract: A method of testing an electrical conductor assembly having a plurality of networks is divided into a first test routine and in further test routines. A conductor assembly is tested in each test routine. In a first test routine, a field test for detecting short-circuits between the individual networks and a resistance test for detecting open-circuits in said networks are implemented. From the data sets resulting from the field test, complex conductances are determined between at least one antenna employed in the field test and the tested networks, which are used as reference conductances for the further test routines. In the further test routines short-circuits between the networks and/or open-circuits in the networks are detected by sensing a complex actual conductance between each network and at least one antenna and by comparing the actual conductance to the reference conductance. In addition the invention relates to an apparatus for implementing the method.

Abstract: The present invention relates to a method of and an apparatus for handling test pieces in which a stack of test pieces is formed on a lift table of the apparatus and are brought into a predetermined position by a slide, which displaces the test pieces horizontally against a guide bead, with the test pieces being lifted-off the stack and transported to a test position by a first transporter having replaceable test piece-specific holding and positioning elements, and with the test pieces being transported from the test position to a storing position by a second transported having replaceable test piece-specific holding elements.