Abstract: An apparatus for converting a two-port vector network analyzer to an N-port vector network analyzer and for calibrating the N-port vector network analyzer includes a test set having a first port coupled to a first port of the two-port vector network analyzer, a second port coupled to a second port of the two-port vector network analyzer and N-ports. The test set includes a circuit that selectively couples one of the N-ports of the test set to the second port of the test set. The apparatus also includes a multi-state transfer standard having N-ports coupled, respectively, to the N-ports of the test set. The multi-state transfer standard provides, at each of the N-ports of the multi-state transfer standard, a plurality of conditions necessary to calibrate the two-port vector network analyzer.

Abstract: A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devices are biased to generate different conditions at each of the two ports. A control computer controls the biasing of devices according to a predetermined procedure and compares impedance values measured for at least one of the two ports of the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are used by the network analyzer in performing further measurements.

Abstract: A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devices are biased to generate different conditions at each of the two ports. A control computer controls the biasing of devices according to a predetermined procedure and compares impedance values measured for at least one of the two ports of the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are used by the network analyzer in performing further measurements.

Abstract: A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devices are biased to generate different conditions at each of the two ports. A control computer controls the biasing of devices according to a predetermined procedure and compares impedance values measured for at least one of the two ports of the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are used by the network analyzer in performing further measurements.

Abstract: A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devices are biased to generate different conditions at each of the two ports. A control computer controls the biasing of devices according to a predetermined procedure and compares impedance values measured for at least one of the two ports of the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are used by the network analyzer in performing further measurements.

Abstract: An electronic microwave calibration device provides an electronic load connected to each of two ports of a vector network analyzer. The load comprises a plurality of PIN diodes interconnected by transmission line. Each of the diodes are biased to generate different loads or conditions at each of the two ports. A control computer controls the biasing of diodes according to a predetermined procedure and compares impedance values measured at each of the two ports by the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are stored in the network analyzer and used by the network analyzer in performing further measurements.

Abstract: A high power solid state load comprises at least two arrays of solid state switching devices. The switching devices can comprise PIN diodes formed on a semi-conductor wafer. The arrays are connected to two ports of a combiner network and each of the switching devices in the arrays is driven either fully on or fully off in order to provide a load having high power handling capabilities and a large number of discrete impedance states.