Abstract: A robotic system automatically aligns, and/or tests alignment of, a lens to a digital camera or other workpiece. The system includes an optical target, an intermediate lens and a plurality of collimators peripheral to the intermediate lens to accommodate a wide range of fields of view of the workpieces, without requiring changes in equipment hardware. When manufacturing or testing a workpiece with a relatively narrow field of view, the entire field of view of the workpiece can be filled with a view of the target through the intermediate lens, and the collimators need not be used. However, when manufacturing or testing a camera having a relatively large field of view, the intermediate lens is used to fill a central portion of the field of view with an image of the target, and the collimators are used to fill a remaining portion of the field of view with images of reticles.

Abstract: In an optical components automatic alignment robot, a motorized target moves closer or further from a digital camera being tested or assembled. A light sensor is used to automatically calibrate an ultraviolet (UV) or other light source used for curing adhesive. An automatic surface finder is used to accurately and repeatably find a surface on which adhesive is to be dispensed.

Abstract: In an optical components automatic alignment robot, a motorized target moves closer or further from a digital camera being tested or assembled. A light sensor is used to automatically calibrate an ultraviolet (UV) or other light source used for curing adhesive. An automatic surface finder is used to accurately and repeatably find a surface on which adhesive is to be dispensed.

Abstract: Methods and apparatus for actively aligning a first optical element, such as a lens, to a second optical element, such as an image sensor, use continuous scans, even absent a synchronization signal from one of the optical elements. During a scan, timed position information about the scanned optical element is collected, and then a relationship between position of the scanned optical element and time is estimated, such as by fitting a curve to a set of position-time pairs. This relationship can then be used to estimate locations of the scanned optical element at times when image data or other alignment quality-indicating data samples are acquired. From this alignment quality versus location data, an optimum alignment position can be determined, and the scanned optical element can then be positioned at the determined alignment position.

Abstract: Methods and apparatus actively align a lens to a digital camera sensor. The lens includes a “floating” optical element. One or more test probes are temporarily electrically connected to electrical contacts, such as traces on a flexible printed circuit, of the lens. Motor control signals are injected via the test probes and the electrical contacts, so as to move the floating optical element to a predetermined position and maintain that position during the active alignment process.

Abstract: Methods and apparatus for actively aligning a first optical element, such as a lens, to a second optical element, such as an image sensor, use continuous scans, even absent a synchronization signal from one of the optical elements. During a scan, timed position information about the scanned optical element is collected, and then a relationship between position of the scanned optical element and time is estimated, such as by fitting a curve to a set of position-time pairs. This relationship can then be used to estimate locations of the scanned optical element at times when image data or other alignment quality-indicating data samples are acquired. From this alignment quality versus location data, an optimum alignment position can be determined, and the scanned optical element can then be positioned at the determined alignment position.

Abstract: Apparatus and method for illuminating circuit boards to quickly and efficiently inspect them for various imperfections. An intense light beam is directed at an oblique angle at the surface of the board to be inspected. Some of the light enters the board and is partially scattered while some of it is reflected from the opposite surface. A detector array positioned above the inspected surface is scanned over that surface and distinguishes light and dark areas. Any light opaque area such as a conductive path or pad is a dark area while portions of the board free of circuitry is interpreted as a light area by the detector. Signals from the detector may be employed for many purposes relating to the circuit pattern on the board.