Abstract: The disclosed apparatus provides a universal wheeled cart for carrying electronic devices to be stress tested in a sealed environmental chamber in which the temperature is varied between high and low limits while the power to the electronic components is being turned on and off. The cart is configured to substantially fully occupy the insulated heated chamber which is provided with tracks for the wheels of the cart. In addition to a front access door for admitting the cart, the chamber is provided with a rear rectangular aperture through which a novel rectangular bustle mounted on the cart extends. The bustle support a plurality of connectors through which power is supplied to the electronic devices. Complementary power actuated electrical connectors are mounted in fixed relation to the rear aperture, and when actuated, all power connections to the electronic components are made through the bustle and standardized busses on the cart.