Patents Assigned to Aviv Amirav
  • Patent number: 10790131
    Abstract: Method for producing ions for mass spectrometry analysis, including introducing vaporized sample compounds behind a supersonic nozzle and expanding the sample compounds with a carrier gas from the supersonic nozzle into a supersonic nozzle vacuum chamber proximate thereto for vibrationally cooling the sample compounds prior to their ionization. Sample compounds are ionized by either illumination with vacuum ultra-violet photons produced by a continuously operated vacuum ultra-violet photon source or by electrons produced in a fly-through electron ionization ion source; and the ions are transferred to a mass analyzer mounted in a mass analyzer vacuum chamber to obtain mass spectra from vibrationally cold molecules. A quadrupole mass analyzer mounted may be used to obtain mass spectra with dominant molecular ions and fragment ion intensities below 3% of the molecular ion for hydrocarbons. Carrier gas flow rate may exceed 20 ml/min for vibrationally cooling the sample compounds prior to their ionization.
    Type: Grant
    Filed: May 9, 2019
    Date of Patent: September 29, 2020
    Assignee: AVIV AMIRAV
    Inventor: Aviv Amirav
  • Patent number: 10497548
    Abstract: In a method and apparatus for electron ionization liquid chromatography mass spectrometry (EI-LC-MS) analysis liquid chromatograph output solvent flow is directed together with spray formation gas into a spray formation and vaporization chamber for forming spray droplets which are vaporized to form vaporized sample compounds at a pressure equal to or greater than ambient pressure. A minor portion is conveyed into a heated flow restriction capillary that directly connects the spray formation and vaporization chamber and a non-fly-through electron ionization ion source of a mass spectrometer located inside a vacuum chamber. A major portion is released to atmosphere so that it does not enter the flow restriction capillary and therefore does not reach the non-fly-through electron ionization ion source.
    Type: Grant
    Filed: May 1, 2019
    Date of Patent: December 3, 2019
    Assignee: AVIV AMIRAV
    Inventor: Aviv Amirav
  • Patent number: 9034077
    Abstract: A fast gas chromatograph (GC) method and device for obtaining fast gas chromatography analysis, in which a capillary gas chromatography column is inserted into a resistively heated metal tube located mostly outside a heated oven, which serves as a heated transferline to a flexible column that enters a resistively heated metal tube from a gas chromatograph injector and exits into a gas chromatograph detector. The resistively heated metal tube of the fast GC device has an internal diameter that is over twice the external diameter of the GC column so as to enable the insertion of several capillary GC column loops. The process of column insertion into or removal from the heated tube is aided by touching it with an ultrasound vibrating device that remarkably reduces the friction during column insertion into the metal tube heater.
    Type: Grant
    Filed: October 24, 2013
    Date of Patent: May 19, 2015
    Assignee: Aviv Amirav
    Inventors: Aviv Amirav, Alexander B. Fialkov
  • Patent number: 7928370
    Abstract: An open probe method for sample introduction into a mass spectrometer is disclosed, comprising the steps of: loading a sample holder with sample compounds to be analyzed; heating a probe oven; introducing said sample compounds in said sample holder into said heated probe oven; flowing inert gas into said heated probe oven; vaporizing said sample in said heated probe oven by the combined effect of oven temperature and inert gas flow; entraining said vaporized sample in said inert gas; and, transferring said vaporized sample in inert gas into an ion source of a mass spectrometer; wherein said heated probe oven remains open to the ambient atmosphere during sample introduction and analysis; said inert gas is flowing in said heated probe oven in two directions of a transfer line to a mass spectrometer ion source and to the oven opening; said vaporized sample in inert gas is transferred through a heated transfer line directly into the ionization chamber of an ion source of a mass spectrometer.
    Type: Grant
    Filed: May 21, 2009
    Date of Patent: April 19, 2011
    Assignee: Aviv Amirav
    Inventors: Aviv Amirav, Alexander Gordin
  • Patent number: 6096178
    Abstract: The invention provides a water electrolyzer device for generating a premixed hydrogen and oxygen gas mixture and for directing said gas mixture into a flame ionization detector, the device including a water container for performing water electrolysis; an electrode for passing electrolysis current in the water; and a water mist and vapor pressure management system for the elimination of water mist and reduction of the water relative humidity below the saturation point, the system being located between the water electrolyzer and the flame ionization detector. A method based on water electrolysis for the provision of a combustible gas mixture for the operation of a flame ionization detector is also provided.
    Type: Grant
    Filed: August 24, 1998
    Date of Patent: August 1, 2000
    Assignee: Aviv Amirav
    Inventors: Aviv Amirav, Nitzan Tzanani
  • Patent number: 5741711
    Abstract: A flame based method for analyzing a sample by introducing the sample into a combustible gas mixture, igniting the combustible gas mixture to produce a flame, and detecting a characteristic of the resulting flame to determine the identity and/or concentration of one or more chemical substances in the sample, wherein the combustible gas mixture is generated by water electrolysis. The same method is also utilizable for determining the identity and/or concentration of one or more chemical compounds in the sample. A flame based detector apparatus for analyzing a sample is also described.
    Type: Grant
    Filed: December 4, 1995
    Date of Patent: April 21, 1998
    Assignee: Aviv Amirav
    Inventors: Aviv Amirav, Nitzan Tzanani
  • Patent number: 5742050
    Abstract: There is provided a method for sample introduction into a mass spectrometer for performing sample analysis, including desorbing a sample by a laser beam and forming gaseous sample compounds, sweeping desorbed sample compounds with a carrier gas into a transfer line, transferring the sample compounds in the transfer line into a supersonic nozzle, expanding the sample compounds mixed with the carrier gas from the supersonic nozzle to form a supersonic free jet inside a vacuum chamber of a mass spectrometer, and ionizing and mass analyzing the sample compounds for the purpose of identification and/or quantification of the sample. An apparatus for carrying out the method is also provided.
    Type: Grant
    Filed: September 30, 1996
    Date of Patent: April 21, 1998
    Assignee: Aviv Amirav
    Inventors: Aviv Amirav, Tzvi Shahar, Shai Dagan
  • Patent number: 5686656
    Abstract: There is provided a method for sample introduction into a gas chromatograph for performing sample analysis, in which a sample is introduced into a removable sample container, the container is placed in a sample introduction device, the device with said container is inserted into a gas chromatograph injector, and the sample is then vaporized for effecting analysis thereof by the gas chromatograph. The non-volatile residues of the sample retained in the container after vaporization and are removed with the container prior to performing the next analysis.
    Type: Grant
    Filed: February 27, 1996
    Date of Patent: November 11, 1997
    Assignee: Aviv Amirav
    Inventors: Aviv Amirav, Shai Dagan
  • Patent number: 5055677
    Abstract: A method and apparatus for analyzing a material by: forming and injecting into a vacuum chamber of a mass spectrometer a supersonic molecular beam of a carrier gas mixed with a sample of the material to be analyzed; ionizing the material in the supersonic molecular beam; mass-separating the ions according to their mass; and detecting the mass-separated ions of the material to be analyzed. The ions in the supersonic molecular beam may be filtered from ions of the thermal background molecules and carrier gas after the ionizing step but before the detecting step. The detected ions may then be used for identifying the material.
    Type: Grant
    Filed: June 22, 1990
    Date of Patent: October 8, 1991
    Assignee: Aviv Amirav
    Inventors: Aviv Amirav, Albert Danon