Abstract: The invention relatges to a system for the analysis of samples of the type comprising a work surface (10) on which are arranged a number of racks (4) to support tubes or containers, characterized in that the work surface (10) is realized by means of a plurality of parallel guides (11) having a cross section which is complementarily matchable with a corresponding seat (44) of said rack (4), said seat (44) of said racks (4) having a width which is multiple of the value of the section of said guide (11) and having opposing portions (410) which are corresponding to the profile of the guides (11).

Abstract: The invention relates to a system for the analysis of samples of the type comprising a work surface (10) on which are arranged a number of racks (4) to support tubes or containers, characterized in that the work surface (10) is realized by means of a plurality of parallel guides (11) having a cross section which is complementary matchable with a corresponding seat (44) of said rack (4), said seat (44) of said racks (4) having a width which is multiple of the value of the section of said guide (11) and having opposing portions (410) which are corresponding to the profile of the guides (11).