Patents Assigned to Axelis Technologies, Inc.
  • Patent number: 9711329
    Abstract: A method for improving the productivity of a hybrid scan implanter by determining an optimum scan width is provided. A method of tuning a scanned ion beam is provided, where a desired beam current is determined to implant a workpiece with desired properties. The scanned beam is tuned utilizing a setup Faraday cup. A scan width is adjusted to obtain an optimal scan width using setup Faraday time signals. Optics are tuned for a desired flux value corresponding to a desired dosage. Uniformity of a flux distribution is controlled when the desired flux value is obtained. An angular distribution of the ion beam is further measured.
    Type: Grant
    Filed: December 28, 2015
    Date of Patent: July 18, 2017
    Assignee: Axelis Technologies, Inc.
    Inventors: Bo H. Vanderberg, Andy M. Ray