Patents Assigned to B&W TEK LLC
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Patent number: 10564105Abstract: A system and method for determining the composition of a sample is provided. The system and method according to the present invention comprises: obtaining one or more spectra of the sample; obtaining one or more spectra of one or more target materials; pre-process the sample and the target spectra; providing a variable reduction means that combines certain contiguous spectral variables into a single variable, wherein the intensities of the said single variable is the sum of the intensities of the said spectral variables to be combined; determining an average spectrum and the statistic distribution of the sample and/or each of the target material in the reduced dimension; determining the likelihood the sample had the same composition of each of the one or more target material; and displaying the list of the most likely target material to a user.Type: GrantFiled: August 25, 2015Date of Patent: February 18, 2020Assignee: B&W TEK LLCInventors: Jun Zhao, Xin Jack Zhou
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Patent number: 10345242Abstract: This invention discloses a Reverse Intensity Correction method for spectral library search to correct for instrument response without the side effect of magnifying the noise in the low responsivity region of test spectra. Instead of applying relative intensity correction to the sample test spectra to match the standardized library spectra, a reverse intensity correction is applied to the standardized library spectra to match the uncorrected sample spectrum. This simple procedural change improves library search performance, especially for dispersive CCD Raman analyzers using NIR excitations, where the instrument response often varies greatly across the spectral range, and SNR in the low responsivity regions is typically poor.Type: GrantFiled: October 2, 2017Date of Patent: July 9, 2019Assignee: B&W TEK LLCInventors: Jun Zhao, Xin Jack Zhou
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Patent number: 10215703Abstract: This invention relates to a light delivery and collection device for performing spectroscopic analysis of a subject. The light delivery and collection device comprises a reflective cavity with two apertures. The first aperture receives excitation light which then diverges and projects onto the second aperture. The second aperture is applied to the subject such that the reflective cavity substantially forms an enclosure covering an area of the subject. The excitation light interacts with the covered area of the subject to produce inelastic scattering and/or fluorescence emission from the subject. The reflective cavity reflects the excitation light as well as the inelastic scattering and/or fluorescence emission that is reflected and/or back-scattered from the subject and redirects it towards the subject. This causes more excitation light to penetrate into the subject hence enabling sub-surface measurement and also improves the collection efficiency of the inelastic scattering or fluorescence emission.Type: GrantFiled: August 3, 2018Date of Patent: February 26, 2019Assignee: B&W Tek LLCInventors: Jun Zhao, Xin Jack Zhou, Sean Xiaolu Wang
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Publication number: 20180372540Abstract: This invention relates to a light delivery and collection device for performing spectroscopic analysis of a subject. The light delivery and collection device comprises a reflective cavity with two apertures. The first aperture receives excitation light which then diverges and projects onto the second aperture. The second aperture is applied to the subject such that the reflective cavity substantially forms an enclosure covering an area of the subject. The excitation light interacts with the covered area of the subject to produce inelastic scattering and/or fluorescence emission from the subject. The reflective cavity reflects the excitation light as well as the inelastic scattering and/or fluorescence emission that is reflected and/or back-scattered from the subject and redirects it towards the subject. This causes more excitation light to penetrate into the subject hence enabling sub-surface measurement and also improves the collection efficiency of the inelastic scattering or fluorescence emission.Type: ApplicationFiled: August 3, 2018Publication date: December 27, 2018Applicant: B&W Tek LLCInventors: Jun Zhao, Xin Jack Zhou, Sean Xiaolu Wang
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Patent number: 10126244Abstract: This invention relates to a light delivery and collection device for performing spectroscopic analysis of a subject. The light delivery and collection device comprises a reflective cavity with two apertures. The first aperture is configured to receive excitation light which then diverges and projects onto the second aperture. The second aperture is configured to be applied close to the subject such that the reflective cavity substantially forms an enclosure covering a large area of the subject. The excitation light enters and interacts with the covered area of the subject to produce inelastic scattering and/or fluorescence emission from the subject. The reflective cavity has a specular reflective surface with high reflectivity to the excitation light as well as to the inelastic scattering and/or fluorescence emission from the subject. The reflective cavity reflects the excitation light that is reflected and/or back-scattered from the subject and redirects it towards the subject.Type: GrantFiled: March 17, 2017Date of Patent: November 13, 2018Assignee: B&W TEK LLCInventors: Jun Zhao, Xin Jack Zhou, Sean Xiaolu Wang
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Patent number: 10119916Abstract: This invention relates to a light delivery and collection device for measuring Raman scattering from a large area of a sample. The light delivery and collection device comprises a reflective cavity made of a material or having a surface coating with high reflectivity to the excitation light and the Raman scattered light. The reflective cavity has two apertures. The first aperture is configured to receive the excitation light which then projects onto the second aperture. The second aperture is configured to be applied close to the sample such that the reflective cavity substantially forms an enclosure covering a large area of the sample. The excitation light produces Raman scattered light from the covered area of the sample. The reflective cavity reflects any excitation light and Raman light scattered from the sample unless the excitation light and the Raman scattered light either emit from the first aperture to be measured with a spectrometer device, or are re-scattered by the sample at the second aperture.Type: GrantFiled: December 14, 2016Date of Patent: November 6, 2018Assignee: B&W TEK LLCInventors: Jun Zhao, Xin Jack Zhou, Sean Xiaolu Wang
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Patent number: 10119917Abstract: This invention relates to an apparatus and method for performing bidirectional Raman spectroscopy of a sample, preferably a diffusely scattering sample, in which two excitation light sources are employed to illuminate the sample from two opposite directions to excite Raman scattering signal from the sample. The Raman scattering signal which transmits through the sample are collected by two optical devices each positioned on the opposite side of the sample to obtain two transmission Raman spectra of the sample, which enables the accurate determination of the composition of the whole sample.Type: GrantFiled: July 19, 2017Date of Patent: November 6, 2018Assignee: B & W Tek LLCInventors: Jun Zhao, Xin Jack Zhou, Sean Xiaolu Wang
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Patent number: 10113969Abstract: This invention relates to a light delivery and collection device for measuring Raman scattering from a large area of a sample. The light delivery and collection device comprises a reflective cavity made of a material or having a surface coating with high reflectivity to the excitation light and the Raman scattered light. The reflective cavity has two apertures. The first aperture is configured to receive the excitation light which then projects onto the second aperture. The second aperture is configured to be applied close to the sample such that the reflective cavity substantially forms an enclosure covering a large area of the sample. The excitation light produces Raman scattered light from the covered area of the sample. The reflective cavity reflects any excitation light and Raman light scattered from the sample unless the excitation light and the Raman scattered light either emit from the first aperture to be measured with a spectrometer device, or are re-scattered by the sample at the second aperture.Type: GrantFiled: November 11, 2016Date of Patent: October 30, 2018Assignee: B&W TEK LLCInventors: Jun Zhao, Xin J. Zhou