Abstract: The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(?), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(?) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm?1. According to the method of the invention, partial correction functions Fi(?) are generated by forming the quotient of the measured fluorescence spectra Ji(?) and the corresponding corrected fluorescence spectra Ii(?), which are then combined to form a total correction function F(?) for a broad spectral range.
Type:
Grant
Filed:
March 23, 2010
Date of Patent:
May 24, 2011
Assignees:
Sigma-Aldrich GmbH, BAM Bundesanstalt für Materialforschung und-prüefung
Inventors:
Ute Resch-Genger, Dietmar Pfeifer, Christian Monte, Angelika Hoffmann, Pierre Nording, Bernhard Schönenberger, Katrin Hoffmann, Monika Spieles, Knut Rurack