Patents Assigned to Battelle Memorial Istitute
  • Patent number: 7541576
    Abstract: A method for analyzing analytes from a sample introduced into a Spectrometer by generating a pseudo random sequence of a modulation bins, organizing each modulation bin as a series of submodulation bins, thereby forming an extended pseudo random sequence of submodulation bins, releasing the analytes in a series of analyte packets into a Spectrometer, thereby generating an unknown original ion signal vector, detecting the analytes at a detector, and characterizing the sample using the plurality of analyte signal subvectors. The method is advantageously applied to an Ion Mobility Spectrometer, and an Ion Mobility Spectrometer interfaced with a Time of Flight Mass Spectrometer.
    Type: Grant
    Filed: February 1, 2007
    Date of Patent: June 2, 2009
    Assignee: Battelle Memorial Istitute
    Inventors: Mikhail E. Belov, Richard D. Smith