Patents Assigned to BEAMIND
  • Publication number: 20080143355
    Abstract: A method for testing or measuring electric elements, includes applying a beam of particles to a location of an electric element. Charges are liberated under the effect of the application of the beam of particles. The liberated charges are collected by a collector. The collected quantity of charges is measured, and an electric feature is deduced from the measure of the collected quantity of charges.
    Type: Application
    Filed: July 31, 2007
    Publication date: June 19, 2008
    Applicant: BEAMIND
    Inventor: Gerard DELABOUGLISE
  • Publication number: 20080018349
    Abstract: A method for testing or measuring electric elements uses at least one electron-discharging electrode, at least one electron-collecting electrode and at least one source of a beam of particles. The method includes ejecting electrons present in the discharging electrode by use of the beam of particles and injecting into an element the electrons supplied by the discharging electrode, and ejecting electrons present in an element by means of the beam of particles and collecting by the collecting electrode the electrons ejected from the element. The ejection of electrons present in the discharging electrode includes the application to the discharging electrode of a reflected beam of particles resulting from the reflection of an incident beam of particles on at least one element.
    Type: Application
    Filed: August 3, 2007
    Publication date: January 24, 2008
    Applicant: BEAMIND
    Inventors: Christophe Vaucher, Jean-Jacques Aubert
  • Publication number: 20080006427
    Abstract: A method for testing electric elements includes applying a first beam of particles to a first location of an electric element, to liberate electrons from the first location, and applying a second beam of particles to a second location of an electric element, with a temporal shift (?t) different from zero in relation to the application of the first beam of particles, to liberate electrons from the second location. The temporal shift is on the order of magnitude of a propagation time of electrons between the first and the second location. Electrons liberated under the effect of the first and second beams of particles are collected, and at least one quantity of electric charges corresponding to the collected electrons liberated under the effect of the second beam of particles is measured and quantitatively or qualitatively deducing therefrom an electric feature of the electric element.
    Type: Application
    Filed: August 3, 2007
    Publication date: January 10, 2008
    Applicant: BEAMIND
    Inventors: Christophe Vaucher, Pierre Benech