Patents Assigned to BEIJERT ENGINEERING
  • Apparatus and method for inspecting pins on a probe card
    Patent number: 9417308
    Abstract: Embodiments described herein generally relate to methods and apparatuses for ensuring the integrity of probe card assemblies and verifying that probe cards are ready for testing. In one embodiment, an apparatus includes a stage that allows stable and precise movement of a sensor. The stage includes a first support, a second support, and a sensor carrier. A plurality of lifting devices is coupled to the second support and the sensor carrier, providing a more stable and precise movement for the sensor carrier. Methods for identifying objects other than the probes disposed on a surface of a probe card and to determine whether the probe card is ready for use are disclosed.
    Type: Grant
    Filed: July 3, 2014
    Date of Patent: August 16, 2016
    Assignee: Stichting Continuiteit Beijert Engineering
    Inventor: Oscar Beijert
  • Probe apparatus
    Patent number: 9234853
    Abstract: The present invention generally relates to methods and apparatuses for ensuring the integrity of probe card assemblies, verifying that probe cards are ready for testing, and allowing analysis of probe card performance characteristics. In one embodiment, an apparatus allows rework of a probe card at an angle from a front position of the apparatus.
    Type: Grant
    Filed: June 7, 2013
    Date of Patent: January 12, 2016
    Assignee: BEIJERT ENGINEERING
    Inventor: Oscar Beijert
  • APPARATUS AND METHOD FOR INSPECTING PINS ON A PROBE CARD
    Publication number: 20150010205
    Abstract: Embodiments described herein generally relate to methods and apparatuses for ensuring the integrity of probe card assemblies and verifying that probe cards are ready for testing. In one embodiment, an apparatus includes a stage that allows stable and precise movement of a sensor. The stage includes a first support, a second support, and a sensor carrier. A plurality of lifting devices is coupled to the second support and the sensor carrier, providing a more stable and precise movement for the sensor carrier. Methods for identifying objects other than the probes disposed on a surface of a probe card and to determine whether the probe card is ready for use are disclosed.
    Type: Application
    Filed: July 3, 2014
    Publication date: January 8, 2015
    Applicant: Stichting Continuiteit Beijert Engineering
    Inventor: Oscar BEIJERT
  • PROBE APPARATUS
    Publication number: 20140015955
    Abstract: The present invention generally relates to methods and apparatuses for ensuring the integrity of probe card assemblies, verifying that probe cards are ready for testing, and allowing analysis of probe card performance characteristics. In one embodiment, an apparatus allows rework of a probe card at an angle from a front position of the apparatus.
    Type: Application
    Filed: June 7, 2013
    Publication date: January 16, 2014
    Applicant: BEIJERT ENGINEERING
    Inventor: Oscar Beijert