Abstract: The present invention discloses a method and an analysis apparatus for determining an operational state of a contact device. The method comprising detecting a change in one of temperature and/or proximity data of a contact surface of the contact device with reference to a baseline value. Thereafter, the method comprising generating at least one of temperature profile and proximity profile from the detected change in the at least one of temperature and/or proximity data of the contact surface of the contact device and the baseline value. Lastly, the method comprising comparing the at least one of temperature profile and/or proximity profile with corresponding standard profiles stored in a memory of an analysis apparatus and determining the operational state of the contact device based on the comparison. The contact device may be one of a contact surface, a stethoscope, or a surface monitor.