Abstract: An AtomChip device and a method for trapping, manipulating and measuring atoms in ultra high vacuum chamber, and for increasing the lifetime of the trapped atoms, the AtomChip device including at least one conductive element, made of metal, wherein at least part of the metal is a dilute alloy metal, and wherein the at least one conductive element has a low working temperature.
Type:
Application
Filed:
January 29, 2006
Publication date:
June 24, 2010
Applicant:
Ben Gurin University Of The Negev Research And Dev elopment Authority
Inventors:
Valery Dikovsky, Ron Folman, Yoni Japha