Patents Assigned to Bendix Automation Company
  • Patent number: 4513507
    Abstract: A coordinate measuring machine probe of the type including an arrangement for detecting contact with a surface, in which a light source and a plurality of photocells are arranged to generate an electrical signal upon probe pivoting motion by detection changes in light intensity sensed by the photodetectors. A summing circuit measures the total incident illumination of the photocells and controls the light source to maintain the total illumination of the photocells to be constant.
    Type: Grant
    Filed: September 2, 1983
    Date of Patent: April 30, 1985
    Assignee: Bendix Automation Company
    Inventor: Edward L. Laskowski