Patents Assigned to Bently Nevada, LLC
-
Patent number: 6850077Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 30, 2003Date of Patent: February 1, 2005Assignee: Bently Nevada, LLCInventor: Richard D. Slates
-
Patent number: 6850078Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 30, 2003Date of Patent: February 1, 2005Assignee: Bently Nevada, LLCInventor: Richard D. Slates
-
Patent number: 6847217Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 30, 2003Date of Patent: January 25, 2005Assignee: Bently Nevada, LLCInventor: Richard D. Slates
-
Patent number: 6842020Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 30, 2003Date of Patent: January 11, 2005Assignee: Bently Nevada, LLCInventor: Rich Slates
-
Patent number: 6825676Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 27, 2003Date of Patent: November 30, 2004Assignee: Bently Nevada, LLCInventor: Richard D. Slates
-
Patent number: 6819122Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibrations method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 29, 2003Date of Patent: November 16, 2004Assignee: Bently Nevada, LLCInventor: Richard D. Slates
-
Patent number: 6816816Abstract: A transducer fault detection system that transforms transducer measurements into slew rate measurement, and determines which, if any, of the slew rate measurement are anomalous or correlative to faults. The system can generate alarms based on these determinations. The system may also transform transducer measurements into digitized voltage measurements, determine how long a succession of the digitized voltage measurements remain within at least one defined voltage window, and determine if there is a correlation between the determined time duration of digitized voltage measurements and an anomalous condition. Each determined anomalous condition may then be associated to a defined fault for gaining fault specificity.Type: GrantFiled: February 12, 2003Date of Patent: November 9, 2004Assignee: Bently Nevada, LLCInventors: Richard D. Slates, Ingrid M. Foster, Roger G. Harker
-
Patent number: 6798194Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 30, 2003Date of Patent: September 28, 2004Assignee: Bently Nevada, LLCInventor: Richard D. Slates
-
Patent number: 6799139Abstract: A System for determining machine running speed by sampling and digitizing a complex signal sensed by a transducer monitoring a machine into a digitized signal; mixing the digitized signal with a digitized signal having a predetermined frequency for obtaining a stream of inphase and quadrature components; filtering intervals of the stream of components for obtaining a plurality of vectors each having a phase; determining a unknown signal frequency of a vibration component contained in the complex vibration signal as a function of at least the one phase per second value, and calculating the machine running speed as a function of the plurality of vectors.Type: GrantFiled: February 7, 2003Date of Patent: September 28, 2004Assignee: Bently Nevada, LLCInventor: Richard D. Slates
-
Patent number: 6789030Abstract: A portable data collector and analyzer apparatus and method provides predictive and preventative maintenance of a multiplicity of assets through the use of a unique architecture that allows a variety of different application programs to be downloaded to the apparatus for providing a single multi-purpose portable data collector and analyzer apparatus that can employ the variety of different application programs for configuring, inter alia, different measurements types, different transducers types and different signal processing types for collecting and analyzing sensed physical data from a variety of different assets found in industrial plants. A unique frequency shifting and decimation method is employed for spectrum calculation that, inter alia, retains DSP addressing efficiency and increases signal processing speed. Additionally, a unique synchronous sampling method is employed that generates synchronous sample waveforms from asynchronous sample waveforms.Type: GrantFiled: June 23, 2000Date of Patent: September 7, 2004Assignee: Bently Nevada, LLCInventors: Sean Coyle, Christopher Dagnall, Andrew Barnes, Anthony Doggett, Dean Wood
-
Patent number: 6775576Abstract: An industrial plant asset management system comprising of a synchronized multiple view graphical user interface combining simultaneous real time and database display capability, a database including a knowledge manager and having input and output interfaces, a normalizing data acquisition module with real time and database interfaces, and a variety of device dependent data collector modules with associated signal conditioning and processing devices for providing an environment for development and deployment of visual models for monitoring plant assets.Type: GrantFiled: July 8, 2002Date of Patent: August 10, 2004Assignee: Bently Nevada, LLCInventors: Robert L. Spriggs, Robert D. Hayashida, Kenneth P. Ceglia, Diana L. Seymour, Michael D. Peden, Paul F. Richetta, Matthew D. Anderson, Richard P. Bennington, Daryl R. Frogget, Scott A. Roby, Denmark A. Jensen
-
Patent number: 6765395Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 29, 2003Date of Patent: July 20, 2004Assignee: Bently Nevada, LLCInventor: Richard D. Slates
-
Apparatus for determining a gap between a proximity probe component and a conductive target material
Patent number: 6756794Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 30, 2003Date of Patent: June 29, 2004Assignee: Bently Nevada, LLCInventor: Richard D. Slates -
Patent number: 6727688Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 29, 2003Date of Patent: April 27, 2004Assignee: Bently Nevada, LLCInventor: Richard D. Slates
-
Patent number: 6727687Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 29, 2003Date of Patent: April 27, 2004Assignee: Bently Nevada, LLCInventor: Richard D. Slates
-
Patent number: 6703843Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: May 27, 2003Date of Patent: March 9, 2004Assignee: Bently Nevada, LLCInventor: Richard D. Slates
-
Patent number: 6664782Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: GrantFiled: January 8, 2002Date of Patent: December 16, 2003Assignee: Bently Nevada, LLCInventor: Richard D. Slates
-
Patent number: 6643909Abstract: Method of making a proximity probe including providing a preform having an interior cavity accessible by an opened rearward end; coupling a coil to the preform proximate a forward most end of the preform for defining an assembly; locating a single support pin through the rearward end such that the support pin extends within the interior cavity while having an end emanating from the rearward end; cantilevering the emanating end between an upper and a lower mold plate defining a mold cavity for supporting the assembly; injecting moldable material into the mold cavity for molding an encapsulation of material over the assembly for defining an encapsulated probe tip, allowing the encapsulated probe tip to cure; removing the encapsulated probe tip from the mold cavity; removing the support pin from the assembly, and coupling a cable to the encapsulated probe tip for forming the proximity probe.Type: GrantFiled: April 10, 2001Date of Patent: November 11, 2003Assignee: Bently Nevada LLCInventor: Robert Ivan Rose
-
Patent number: 6533494Abstract: A transducer mounting device comprised of a monolith of moldable material overlying and supporting a self-tapping screw at one end for coupling to a target such as a machine casing or bearing housing and a fabricated insert at an opposite end for mating with a monitoring transducer. In a further preferred form a transducer mounting device is comprised of a preform including an internal cavity overlying a magnetic component, an adhesive interposed between the magnetic component and a target such as a machine casing or bearing housing at one end for magnetically and adhesively bonding said preform to the target and a threaded member disposed at an opposite end of the preform for mating with a monitoring transducer.Type: GrantFiled: July 16, 1999Date of Patent: March 18, 2003Assignee: Bently Nevada, LLCInventor: John Robert Gordon