Abstract: The invention relates to a recognizable carrier for determining physical, chemical or biochemical interactions by means of optical measurement methods. The carrier comprises a surface that defines a substrate surface and that has a base layer coated with reactive elements, which are bonded to receptor molecules, wherein the base layer and/or the reactive elements are provided with a pattern of holes which forms a code and/or the reactive elements are provided with linker molecules or markers which form a code. The substrate surface may additionally have a macroscopically planar pattern which is applied using laser light or chemical etching and forms a code. The invention likewise relates to a method for producing a recognizable carrier for spectroscopic processes and/or intensiometric tests to determine said interactions. The code to recognize the carrier can be controlled via a read-out unit coupled to the photometric analysis unit.

Abstract: In a method for determining optical properties by measuring intensities at a thin layer, light is directed into the thin layer and passes through a beam splitter, which directs a first part of the light onto the thin layer and a second part of the light onto a reference detector. Interference of the first part of the light in the thin layer is detected via a high-resolution detector and forwarded to an evaluating unit, which determines the reflection and/or transmission coefficients, which are correlated with the optical layer thickness through a comparison using at least one database stored in the evaluating unit. The optical layer thickness is obtained as a gray value modification by way of a gray scale value analysis and a conversion factor stored in the at least one data base. A corresponding device and intended uses of the method and device are also described.

Abstract: The invention relates to a method for determining optical properties by measuring intensities on a thin layer, wherein light is irradiated onto a carrier (105) that has said thin layer and that is at least partially transparent. Interferences on the at least one thin layer are measured as the relative intensity of at least one superpositioned wave, optionally using filter arrangements (113, 115, 117) provided for this purpose, whereupon the reflection coefficient(s) and/or the transmission coefficient(s) from the reflection and/or the transmission on the thin layer are determined. Preferably, the intensity of at least two superpositioned waves is measured. The light may be irradiated directly onto the carrier. The invention also relates to a device for determining optical properties by measuring intensities on a thin layer, said device comprising an analysis unit which stores at least one lookup table. The method and the device are preferably used in the area of homeland security.

Abstract: In a method for determining optical properties by measuring intensities at a thin layer, light is directed into the thin layer and passes through a beam splitter, which directs a first part of the light onto the thin layer and a second part of the light onto a reference detector. Interference of the first part of the light in the thin layer is detected via a high-resolution detector and forwarded to an evaluating unit, which determines the reflection and/or transmission coefficients, which are correlated with the optical layer thickness through a comparison using at least one database stored in the evaluating unit. The optical layer thickness is obtained as a gray value modification by way of a gray scale value analysis and a conversion factor stored in the at least one data base. A corresponding device and intended uses of the method and device are also described.