Patents Assigned to Bini Ate, LLC
  • Digital waveform generation and measurement in automated test equipment
    Patent number: 8423315
    Abstract: A waveform generation and measurement module that may be used in automated test equipment. The waveform generation and measurement module includes high speed SERDES (or other shift registers) that are used to digitally draw a test waveform. Additional high speed SERDES may also be used to receive (in serial form) a response waveform from a device under test and convert it to parallel data for high speed processing. The waveform generation and measurement module may be implemented in field programmable gate array logic.
    Type: Grant
    Filed: March 3, 2010
    Date of Patent: April 16, 2013
    Assignee: Bini Ate, LLC
    Inventors: William F. Kappauf, Barry Edward Blancha, Tetsuro Nakao