Abstract: A method and system for automatically processing images from a micro-array uses an image processor that is controlled by software. The software controls the microprocessor to process images to ensure that the images meet a predetermined threshold. The microprocessor automatically calculates a size of spot image, a spacing between adjacent spot images, generates a first grid and adjusts the first grid to fit the spot images being processed.

Abstract: A new high resolution confocal and non-confocal scanning laser macroscope is disclosed which achieves fine focus and control of focus position by moving a lens in the intermediate optics. This arrangement is particularly useful for imaging specimens where it is difficult to focus by changing the distance between the scan lens and the specimen, for example for in-vivo imaging, photodynamic therapy, and image-guided surgery. It is also important to keep the lens-to-specimen distance constant when a liquid-immersion scan lens is used, in order to maintain a constant thickness of liquid between the lens and the specimen. In addition to being useful for confocal slicing, motion of the intermediate lens under computer control also enables dynamic focus and the ability to move the focal spot along a general path inside the specimen. Several applications of the imaging system are described.

Abstract: A non-confocal scanning beam optical imaging or mapping system for macroscopic samples is disclosed, in which an expanded laser beam passes through a scan system and a telecentric laser scan lens focuses the beam to a moving spot in the sample. Light reflected (or emitted) from the illuminated spot is collected by the laser scan lens, descanned by the scan system, and detected by a detector. Transmitted-light and other non-confocal versions are also disclosed. This new scanning beam laser imaging system performs a rapid scan of a large sample. Applications include fluorescent imaging of large biomedical specimens, including fluorescent gels, photoluminescence mapping of semiconductor samples, etc.