Abstract: Embodiments of the present invention provide for a core stage in an application-specific integrated circuit core which drives both a clock pulse signal and a clock pulse negative/complement signal concurrently, thereby resulting in perfectly aligned signals. The core stage can include a pulse generator, a clock distribution circuit, and a set of latches.

Abstract: Embodiments of the present invention provide for a core stage in an application-specific integrated circuit core which drives both a clock pulse signal and a clock pulse negative/complement signal concurrently, thereby resulting in perfectly aligned signals. The core stage can include a pulse generator, a clock distribution circuit, and a set of latches.

Abstract: Some embodiments provide a voltage-level shifter circuit comprising a cross-coupled transistor pull-up network that includes a plurality of diode-connected transistors configured to cause the state of the cross-coupled transistor network to switch at a low current through a pull-down network coupled thereto, such as a current corresponding to near-threshold voltage or sub-threshold voltage operation of the pull-down network.

Abstract: Some embodiments provide a voltage-level shifter circuit comprising a cross-coupled transistor pull-up network that includes a plurality of diode-connected transistors configured to cause the state of the cross-coupled transistor network to switch at a low current through a pull-down network coupled thereto, such as a current corresponding to near-threshold voltage or sub-threshold voltage operation of the pull-down network.

Abstract: Embodiments of the invention provide for integrated circuits for testing one or more transistors for process variation effects. According to an embodiment, the integrated circuit can include: a plurality of ring oscillator macro circuits, wherein each ring oscillator macro circuit includes two ring oscillators, a first multiplexer, and a first divide-by-two circuit; a multiplexer stage; a divide-by-two circuit stage; a second multiplexer; a second divide-by-two circuit; and frequency measurement circuit. According to another embodiment, the integrated circuit can include: a first shift register including a plurality of devices-under-test; a second shift register including a plurality of static latches; a first multiplexer configured to receive outputs from each of the plurality of DUTs; a second multiplexer configured to receive outputs from each of the plurality of static latches; and a comparator configured to compare an output from the first multiplexer with an output from the second multiplexer.

Abstract: Embodiments of the invention provide for a dynamic pulse generator which can combine both the sequential element and the pulse logic into one stage, thereby eliminating the wasted time resulting from a pulse generator' input-to-output propagation delay. The dynamic pulse generator can include a plurality of P-MOS an N-MOS transistors, a first delay element, and a second delay element.

Abstract: Power dissipation of sequential static latch, implemented in CMOS, may be reduced by removing clocked elements from the circuit. One way to do this may be to replace a clocked digital feedback path with an analog programmable feedback path. An analog programmable feedback path, such as disclosed, may, for example, provide a constant, non-clocked bias by providing constant bias voltages to transistors in the feedback path such that they function as analog devices rather than digital switches. This bias may be adjusted, e.g., to reflect the circuit's operating environment.