Abstract: A data storage device includes a dynamic latch circuit. The dynamic latch circuit includes a first NMOS transistor, a second NMOS transistor, a first PMOS transistor, and a second PMOS transistor. A source terminal of the first NMOS transistor is connected to a source terminal of the first PMOS transistor to form a data input terminal. A drain terminal of the first NMOS transistor is connected to a drain terminal of the first PMOS transistor to form a latch internal node. A gate terminal of the first NMOS transistor is connected to a clock input signal. A gate terminal of the first PMOS transistor is connected to an inverse clock input signal. A gate terminal of the second NMOS transistor and a gate terminal of the second PMOS transistor are connected to the latch internal node. A drain terminal of the second NMOS transistor and a drain terminal of the second PMOS transistor are connected to form an inverted output terminal.