Abstract: A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. The present invention includes a database of data, wherein a first set of data is used for comparison with a second set of data to determine the conditions of the material microstructure.
Type:
Grant
Filed:
March 28, 2008
Date of Patent:
May 17, 2011
Assignee:
Board of Regents of the Universtiy of Nebraska