Abstract: A system for measuring the voltage potential across test coupons, reference cells and metal structures is disclosed. The system may evaluate the amount of cathodic protection that may be applied to the metal structure. A series resistor may be configured between at least one of the test coupons and the metal structure so that the at least one test coupon may be at a lower voltage potential than the metal structure.
Abstract: A system for measuring the voltage potential across test coupons, reference cells and metal structures is disclosed. The system may evaluate the amount of cathodic protection that may be applied to the metal structure. A series resistor may be configured between at least one of the test coupons and the metal structure so that the at least one test coupon may be at a lower voltage potential than the metal structure.