Patents Assigned to BRECHTEL MANUFACTURING, INC.
  • Patent number: 10261049
    Abstract: A system and method comprising an ion production chamber having an ultra-violet light source disposed towards said chamber, a coated quartz plate between the chamber and the UV source whose coating absorbs incident UV light and ejects electrons into the chamber through the photoelectric effect, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. In some embodiments the harvest gas and particle sample jet are one and the same. The charge sample may be coupled to a MEMS-based electrometer.
    Type: Grant
    Filed: July 11, 2018
    Date of Patent: April 16, 2019
    Assignee: Brechtel Manufacturing, Inc.
    Inventors: Fredrick J Brechtel, Xerxes Lopez-Yglesias
  • Publication number: 20180321190
    Abstract: A system and method comprising an ion production chamber having an ultra-violet light source disposed towards said chamber, a coated quartz plate between the chamber and the UV source whose coating absorbs incident UV light and ejects electrons into the chamber through the photoelectric effect, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. In some embodiments the harvest gas and particle sample jet are one and the same. The charge sample may be coupled to a MEMS-based electrometer.
    Type: Application
    Filed: July 11, 2018
    Publication date: November 8, 2018
    Applicant: Brechtel Manufacturing, Inc.
    Inventors: Fredrick J. Brechtel, Xerxes Lopez-Yglesias
  • Patent number: 9759685
    Abstract: A system and method comprising an ion production chamber having a ultra-violet light source disposed towards said chamber, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet, said jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. The charge sample may be coupled to a MEMS-based electrometer.
    Type: Grant
    Filed: July 15, 2015
    Date of Patent: September 12, 2017
    Assignee: Brechtel Manufacturing, Inc.
    Inventors: Fredrick J Brechtel, Xerxes Lopez-Yglesias
  • Patent number: 9753013
    Abstract: A system and method comprising a charger for ionizing aerosols; a spectrometer coupled to the charger and operable to select for a predetermined particle size; a porous charge collector coupled to the spectrometer, and a MEMS electrometer. In some embodiments the charge collector may be a metal frit electrically coupled to the electrometer. The electrometer may include a comb drive actuator coupled to a moving shuttle supported on flexures.
    Type: Grant
    Filed: May 17, 2014
    Date of Patent: September 5, 2017
    Assignee: Brechtel Manufacturing, Inc.
    Inventors: Fredrick J Brechtel, David A. Horsley, Gerardo Jaramillo
  • Publication number: 20150330944
    Abstract: A system and method comprising an ion production chamber having a ultra-violet light source disposed towards said chamber, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet, said jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. The charge sample may be coupled to a MEMS-based electrometer.
    Type: Application
    Filed: July 15, 2015
    Publication date: November 19, 2015
    Applicant: BRECHTEL MANUFACTURING, INC.
    Inventors: Fredrick J. BRECHTEL, Xerxes Lopez-Yglesias
  • Patent number: 9018598
    Abstract: A system and method comprising an ion production chamber having a plasma source disposed in said chamber, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet, said jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. The charge sample may be coupled to a MEMS-based electrometer.
    Type: Grant
    Filed: May 16, 2014
    Date of Patent: April 28, 2015
    Assignee: Brechtel Manufacturing, Inc.
    Inventor: Fredrick J Brechtel
  • Publication number: 20150008932
    Abstract: A system and method comprising a charger for ionizing aerosols; a spectrometer coupled to the charger and operable to select for a predetermined particle size; a porous charge collector coupled to the spectrometer, and a MEMS electrometer. In some embodiments the charge collector may be a metal frit electrically coupled to the electrometer. The electrometer may include a comb drive actuator coupled to a moving shuttle supported on flexures.
    Type: Application
    Filed: May 17, 2014
    Publication date: January 8, 2015
    Applicant: Brechtel Manufacturing, Inc.
    Inventors: Frederick J. Brechtel, David A. Horsley, Gerardo Jaramillo
  • Publication number: 20140340093
    Abstract: A system and method comprising a liquid interface with an electrode. The electrode may be coupled to a MEMS-based electrometer for sensing small amounts of charge imposed on the electrode. In some embodiments ion exchangers may be employed to provide for specific selectivity for certain ions or molecules. The electrometer may include a comb drive actuator coupled to a moving shuttle supported on flexures.
    Type: Application
    Filed: May 16, 2014
    Publication date: November 20, 2014
    Applicant: Brechtel Manufacturing, Inc.
    Inventor: Frederick J. BRECHTEL
  • Publication number: 20140339441
    Abstract: A system and method comprising an ion production chamber having a plasma source disposed in said chamber, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet, said jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. The charge sample may be coupled to a MEMS-based electrometer.
    Type: Application
    Filed: May 16, 2014
    Publication date: November 20, 2014
    Applicant: BRECHTEL MANUFACTURING, INC.
    Inventor: Frederick J. BRECHTEL