Patents Assigned to Breker Verification Systems
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Patent number: 11748240Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed by components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.Type: GrantFiled: November 3, 2020Date of Patent: September 5, 2023Assignee: Breker Verification SystemsInventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
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Patent number: 11113184Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.Type: GrantFiled: May 19, 2016Date of Patent: September 7, 2021Assignee: Breker Verification SystemsInventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
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Patent number: 11055212Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.Type: GrantFiled: August 27, 2019Date of Patent: July 6, 2021Assignee: Breker Verification SystemsInventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
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Patent number: 10838006Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed by components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.Type: GrantFiled: June 27, 2019Date of Patent: November 17, 2020Assignee: Breker Verification SystemsInventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
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Patent number: 10429442Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.Type: GrantFiled: June 13, 2017Date of Patent: October 1, 2019Assignee: Breker Verification SystemsInventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
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Patent number: 10365326Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed by components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two module representations of the plurality of module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the plurality of module representations, and the one or more connections. The test scenario model includes a path from the input via the plurality of module representations and the one or more connections to the desired output.Type: GrantFiled: January 11, 2018Date of Patent: July 30, 2019Assignee: Breker Verification SystemsInventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
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Patent number: 9874608Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed by components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.Type: GrantFiled: April 26, 2017Date of Patent: January 23, 2018Assignee: Breker Verification SystemsInventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
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Patent number: 9689921Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.Type: GrantFiled: February 26, 2016Date of Patent: June 27, 2017Assignee: Breker Verification SystemsInventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
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Patent number: 9651619Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.Type: GrantFiled: March 25, 2016Date of Patent: May 16, 2017Assignee: Breker Verification SystemsInventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
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Patent number: 9360523Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.Type: GrantFiled: April 17, 2015Date of Patent: June 7, 2016Assignee: Breker Verification SystemsInventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
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Patent number: 9316689Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.Type: GrantFiled: April 17, 2015Date of Patent: April 19, 2016Assignee: Breker Verification SystemsInventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
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Patent number: 9310433Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.Type: GrantFiled: April 17, 2015Date of Patent: April 12, 2016Assignee: Breker Verification SystemsInventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse