Patents Assigned to Bruker Analytic
  • Patent number: 6455987
    Abstract: An electron multiplication apparatus uses a matrix of dielectric particles interspersed with conductive particles. Typically a porous layer of metal oxide and relatively inert metal, the material provides high electron count rates while maintaining good temperature stability. The layer is located between a cathode and an anode that together provide desired voltage differentials. A mesh is also used on a side of the matrix layer opposite the cathode to conduct surface charge away from the matrix, while providing an intermediate voltage potential between that of the anode and the cathode. A voltage source is used to generate the voltage potentials for each of the anode, cathode and mesh layer, and the resulting electric fields provide a device that may be used in the detection of high energy particles and photons, such as x-rays. A preferred method of fabricating the material involves the codeposition of a metal prone to oxidation and a relatively inert metal to form a porous layer.
    Type: Grant
    Filed: January 12, 1999
    Date of Patent: September 24, 2002
    Assignee: Bruker Analytical X-Ray Systems, Inc.
    Inventors: Roger Durst, Yacouba Diawara
  • Patent number: 5861623
    Abstract: An N.sup.th order delayed extraction apparatus and method for use in a time-of-flight mass spectrometer is disclosed. A non-linear electric field, produced by specially formed electrodes, is used to accelerate ions, improve flight time focusing and thereby increase mass resolution.
    Type: Grant
    Filed: May 10, 1996
    Date of Patent: January 19, 1999
    Assignee: Bruker Analytical Systems, Inc.
    Inventor: Melvin Park
  • Patent number: 5821534
    Abstract: A method and apparatus for analyzing ions by determining times of flight including using a deflectron based daughter ion selector for selecting daughter ions. Parent ions generated in an ion source may fragment to form daughter ions. Daughter ions may further fragment to form grand daughter ions. By selecting a specific type of daughter ion from ions formed in the ion source, one may obtain a grand daughter ion spectrum. According to the present invention, a deflectron based daughter ion selector, in the form of two deflectron and a set of selection plates, is used as a daughter ion selector.
    Type: Grant
    Filed: November 22, 1995
    Date of Patent: October 13, 1998
    Assignee: Bruker Analytical Instruments, Inc.
    Inventor: Melvin Park
  • Patent number: 5753909
    Abstract: A method and apparatus for analyzing ions by determining times of flight including using a collision cell to activate ions toward fragmentation and a deflector to direct ions away from their otherwise intended or parallel course. Deflectors are used as gates, so that particular ions may be selected for deflection, while others are allowed to continue along their parallel or otherwise straight path, from the ion source, through a flight tube, and eventually, to a detector. According to the present invention, a postselector, in the form of two deflection plates is used as an ion deflector and is encountered by ions after the collision cell as they progress through the spectrometer.
    Type: Grant
    Filed: November 17, 1995
    Date of Patent: May 19, 1998
    Assignee: Bruker Analytical Systems, Inc.
    Inventors: Melvin Park, Victor George Fursey, John Wronka
  • Patent number: 5744797
    Abstract: A method and apparatus to accelerate ions using two or more electric fields which are spatially separated. Electric fields are used to accelerate ions. With electric fields of the proper strength and geometry, ions may be space focused so that ions of a given mass-to-charge arrive at a virtual object plane simultaneously. According to the present invention, a split field interface, in the form of a set of biased electrodes, is used to produce and adjust the position of a virtual object plane.
    Type: Grant
    Filed: November 22, 1995
    Date of Patent: April 28, 1998
    Assignee: Bruker Analytical Instruments, Inc.
    Inventor: Melvin Park
  • Patent number: 5696375
    Abstract: A method and apparatus to direct ions away from their otherwise intended or parallel course. Deflectors are used to establish electric fields in regions through which ions are to pass. With such electric fields, ions may be deflected to a desired trajectory. According to the present invention, a multideflector, in the form of a series of bipolar plates spaced evenly across the ion beam path, is used as an ion deflector.
    Type: Grant
    Filed: November 17, 1995
    Date of Patent: December 9, 1997
    Assignee: Bruker Analytical Instruments, Inc.
    Inventors: Melvin Park, Claus Koster
  • Patent number: 5512829
    Abstract: A pulsed electron spin resonance spectrometer is provided with a first microwave oscillator for generating measuring signals of a high microwave frequency of about 80 GHz or above. A second microwave oscillator generates auxiliary signals at a lower microwave frequency of about 12 GHz or below. A first mixer generates mixed signals by mixing a measuring signal with an auxiliary signal. A pulse shaping channel generates pulsed mixed signals having a pulse length sufficient for carrying out pulsed electron spin resonance experiments. Moreover, a measuring resonator is provided to which the pulsed mixed signals are applied. A second mixer generates an output signals of a lower microwave frequency by mixing the mixed signal outputted from the measuring resonator with a signal being derived from the first microwave oscillator. A pulse shaping channel is switched between the second microwave oscillator and the first mixer.
    Type: Grant
    Filed: September 22, 1994
    Date of Patent: April 30, 1996
    Assignee: Bruker Analytical Mebtechnik GmbH
    Inventors: Karoly Holczer, Dieter Schmalbein, Peter Hofer
  • Patent number: 5197088
    Abstract: An electron beam x-ray computer tomography scanner is improved so that a compact, tiltable configuration without mechanical motion is achieved. By introducing the electron beam in a direction which is largely parallel rather than perpendicular to the scan plane, the long large diameter evacuated electron beam pipe of prior art is eliminated. As a result, the scan system according to the invention enjoys compact dimensions compared to those of prior art, and free access to the scan region from both the front and back of the scanner is possible.
    Type: Grant
    Filed: May 3, 1991
    Date of Patent: March 23, 1993
    Assignee: Bruker Analytic
    Inventors: Paul Vincent, Gunther Laukien
  • Patent number: 5195112
    Abstract: An X-ray computer tomography system with a stationary ring anode and a plurality of stationary electron sources for the construction of fast scan images from the inside of an object is improved in such a way that there is free access from both sides of the scan region, that the gantry unit can be tilted, and that the image quality which can be achieved is comparable to that of conventional tomography systems with mechanical motion of the anode. A plurality of electron sources are configured in proximity to the ring anode on a stationary ring, with each source being capable of sweeping its respective electron beam over a portion of the anode ring.
    Type: Grant
    Filed: May 3, 1991
    Date of Patent: March 16, 1993
    Assignee: Bruker Analytic
    Inventors: Paul Vincent, Gunther Laukien, Arne Kasten
  • Patent number: 5191600
    Abstract: An X-ray computer tomography system with a ring anode and substantially without mechanically moving parts for the production of fast image slices from the inside of an object is improved in such a way that a detector ring is comprised of two adjacent parallel partial detector rings of substantially equal size, whereby the detector ring is arranged within and coplanar to the anode ring. The two partial rings of the detector ring are displaced in a direction largely pependicular to the scan slice so that a ring-shaped detector ring gap is formed between them through which the fan beam coming from the focal spot on the anode passes.
    Type: Grant
    Filed: May 3, 1991
    Date of Patent: March 2, 1993
    Assignee: Bruker Analytic
    Inventors: Paul Vincent, Gunther Laukien, Arne Kasten